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Electron microscopy based studies of catalytically grown semiconductor nanowires

Gustafsson, Anders LU orcid ; Wallenberg, Reine LU and Wagner, Jakob LU (2008) p.1-35
Abstract
We give an introduction to modern electron microscopy techniques, applied to semiconductor structures. We concentrate on the analytical capabilities of high resolution transmission electron microscopy (TEM) and luminescence-based analysis, cathodoluminescence, in the scanning electron microscope. For the TEM, we will demonstrate a number of techniques and detection schemes, such as energy dispersive analysis of X-rays, electron energy loss spectroscopy, high-angle annular darkfield, and Fourier and strain mapping. The capabilities of the techniques are illustrated by various semiconductor nanowires (NWs), grown catalytically by gold seed-particles on planar substrates. These structures include homogeneous NWs, heterostructured NWs,... (More)
We give an introduction to modern electron microscopy techniques, applied to semiconductor structures. We concentrate on the analytical capabilities of high resolution transmission electron microscopy (TEM) and luminescence-based analysis, cathodoluminescence, in the scanning electron microscope. For the TEM, we will demonstrate a number of techniques and detection schemes, such as energy dispersive analysis of X-rays, electron energy loss spectroscopy, high-angle annular darkfield, and Fourier and strain mapping. The capabilities of the techniques are illustrated by various semiconductor nanowires (NWs), grown catalytically by gold seed-particles on planar substrates. These structures include homogeneous NWs, heterostructured NWs, core-shell NWs and branched NWs. (Less)
Please use this url to cite or link to this publication:
author
; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
Beam Injection Based Nanocharacterization of Advanced Materials
editor
Salviati, Giancarlo ; Sekiguchi, T ; Heun, S and Gustafsson, Anders
pages
1 - 35
publisher
Research Signpost
ISBN
978-81-308-0226-8
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041), Solid State Physics (011013006)
id
ef426a54-c2bb-468c-b26d-2cc1513c1624 (old id 1699407)
date added to LUP
2016-04-04 11:28:33
date last changed
2018-11-21 21:05:06
@inbook{ef426a54-c2bb-468c-b26d-2cc1513c1624,
  abstract     = {{We give an introduction to modern electron microscopy techniques, applied to semiconductor structures. We concentrate on the analytical capabilities of high resolution transmission electron microscopy (TEM) and luminescence-based analysis, cathodoluminescence, in the scanning electron microscope. For the TEM, we will demonstrate a number of techniques and detection schemes, such as energy dispersive analysis of X-rays, electron energy loss spectroscopy, high-angle annular darkfield, and Fourier and strain mapping. The capabilities of the techniques are illustrated by various semiconductor nanowires (NWs), grown catalytically by gold seed-particles on planar substrates. These structures include homogeneous NWs, heterostructured NWs, core-shell NWs and branched NWs.}},
  author       = {{Gustafsson, Anders and Wallenberg, Reine and Wagner, Jakob}},
  booktitle    = {{Beam Injection Based Nanocharacterization of Advanced Materials}},
  editor       = {{Salviati, Giancarlo and Sekiguchi, T and Heun, S and Gustafsson, Anders}},
  isbn         = {{978-81-308-0226-8}},
  language     = {{eng}},
  pages        = {{1--35}},
  publisher    = {{Research Signpost}},
  title        = {{Electron microscopy based studies of catalytically grown semiconductor nanowires}},
  year         = {{2008}},
}