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A low-energy electron microscopy and x-ray photo-emission electron microscopy study of Li intercalated into graphene on SiC(0001)

Virojanadara, C.; Zakharov, Alexei LU ; Watcharinyanon, S.; Yakimova, R. and Johansson, L. I. (2010) In New Journal of Physics 12.
Abstract
The effects induced by the deposition of Li on 1 and 0 ML graphene grown on SiC(0001) and after subsequent heating were investigated using low-energy electron microscopy (LEEM) and x-ray photo-emission electron microscopy (XPEEM). For 1 ML samples, the collected photoelectron angular distribution patterns showed the presence of single pi-cones at the six equivalent K-points in the Brillouin zone before Li deposition but the presence of two pi-cones (pi-bands) after Li deposition and after heating to a few hundred degrees C. For 0 ML samples, no pi-band could be detected close to the Fermi level before deposition, but distinct pi-cones at the K-points were clearly resolved after Li deposition and after heating. Thus Li intercalation was... (More)
The effects induced by the deposition of Li on 1 and 0 ML graphene grown on SiC(0001) and after subsequent heating were investigated using low-energy electron microscopy (LEEM) and x-ray photo-emission electron microscopy (XPEEM). For 1 ML samples, the collected photoelectron angular distribution patterns showed the presence of single pi-cones at the six equivalent K-points in the Brillouin zone before Li deposition but the presence of two pi-cones (pi-bands) after Li deposition and after heating to a few hundred degrees C. For 0 ML samples, no pi-band could be detected close to the Fermi level before deposition, but distinct pi-cones at the K-points were clearly resolved after Li deposition and after heating. Thus Li intercalation was revealed in both cases, transforming the carbon buffer layer (0 ML) to graphene. On 1 ML samples, but not on 0 ML, a (root 3 x root 3) R30 degrees diffraction pattern was observed immediately after Li deposition. This pattern vanished upon heating and then wrinkles/cracks appeared on the surface. Intercalation of Li was thus found to deteriorate the quality of the graphene layer, especially for 1 ML samples. These wrinkles/cracks did not disappear even after heating at temperatures >= 500 degrees C, when no Li atoms remained on the substrate. (Less)
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organization
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Contribution to journal
publication status
published
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in
New Journal of Physics
volume
12
publisher
IOP Publishing Ltd.
external identifiers
  • wos:000285585900012
  • scopus:78650088277
ISSN
1367-2630
DOI
10.1088/1367-2630/12/12/125015
language
English
LU publication?
yes
id
af2ce7b6-c86a-4a4c-9c39-0ab422adb2ef (old id 1815187)
date added to LUP
2011-03-10 09:51:18
date last changed
2018-06-24 04:18:02
@article{af2ce7b6-c86a-4a4c-9c39-0ab422adb2ef,
  abstract     = {The effects induced by the deposition of Li on 1 and 0 ML graphene grown on SiC(0001) and after subsequent heating were investigated using low-energy electron microscopy (LEEM) and x-ray photo-emission electron microscopy (XPEEM). For 1 ML samples, the collected photoelectron angular distribution patterns showed the presence of single pi-cones at the six equivalent K-points in the Brillouin zone before Li deposition but the presence of two pi-cones (pi-bands) after Li deposition and after heating to a few hundred degrees C. For 0 ML samples, no pi-band could be detected close to the Fermi level before deposition, but distinct pi-cones at the K-points were clearly resolved after Li deposition and after heating. Thus Li intercalation was revealed in both cases, transforming the carbon buffer layer (0 ML) to graphene. On 1 ML samples, but not on 0 ML, a (root 3 x root 3) R30 degrees diffraction pattern was observed immediately after Li deposition. This pattern vanished upon heating and then wrinkles/cracks appeared on the surface. Intercalation of Li was thus found to deteriorate the quality of the graphene layer, especially for 1 ML samples. These wrinkles/cracks did not disappear even after heating at temperatures >= 500 degrees C, when no Li atoms remained on the substrate.},
  author       = {Virojanadara, C. and Zakharov, Alexei and Watcharinyanon, S. and Yakimova, R. and Johansson, L. I.},
  issn         = {1367-2630},
  language     = {eng},
  publisher    = {IOP Publishing Ltd.},
  series       = {New Journal of Physics},
  title        = {A low-energy electron microscopy and x-ray photo-emission electron microscopy study of Li intercalated into graphene on SiC(0001)},
  url          = {http://dx.doi.org/10.1088/1367-2630/12/12/125015},
  volume       = {12},
  year         = {2010},
}