X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level
(1970) In Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment 84(1). p.141-143- Abstract
- Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/1837811
- author
- Johansson, Thomas B LU ; Akselsson, Roland LU and Johansson, Sven A E
- organization
- publishing date
- 1970
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- PIXE, particle induced X-ray emission analysis, trace element analysis
- in
- Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment
- volume
- 84
- issue
- 1
- pages
- 141 - 143
- publisher
- Elsevier
- external identifiers
-
- scopus:49849106898
- ISSN
- 0167-5087
- DOI
- 10.1016/0029-554X(70)90751-2
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Ergonomics and Aerosol Technology (011025002), Nuclear Physics (Faculty of Technology) (011013007), The International Institute for Industrial Environmental Economics (IIIEE) (011026001)
- id
- 76d1b721-d3f5-47b7-97dd-4c48466c113d (old id 1837811)
- date added to LUP
- 2016-04-04 11:59:51
- date last changed
- 2021-10-03 03:32:23
@article{76d1b721-d3f5-47b7-97dd-4c48466c113d, abstract = {{Using protons in the MeV region as excitation source and a high resolution Si(Li)-detector, X-ray analysis is capable of detecting many elements at the 10−12 g level simultaneously.}}, author = {{Johansson, Thomas B and Akselsson, Roland and Johansson, Sven A E}}, issn = {{0167-5087}}, keywords = {{PIXE; particle induced X-ray emission analysis; trace element analysis}}, language = {{eng}}, number = {{1}}, pages = {{141--143}}, publisher = {{Elsevier}}, series = {{Nuclear Instruments & Methods in Physics Research. Section A: Accelerators, Spectrometers, Detectors, and Associated Equipment}}, title = {{X-Ray Analysis: Elemental Trace Analysis at the 10-12 g Level}}, url = {{http://dx.doi.org/10.1016/0029-554X(70)90751-2}}, doi = {{10.1016/0029-554X(70)90751-2}}, volume = {{84}}, year = {{1970}}, }