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Nanoprobe-Enabled Electron Beam Induced Current Measurements on III-V Nanowire-Based Solar Cells

Barrigon, Enrique LU ; Otnes, Gaute LU ; Chen, Yang LU ; Zhang, Yuwei LU ; Hrachowina, Lukas LU ; Zeng, Xulu LU ; Samuelson, Lars LU and Borgstrom, Magnus LU (2019) 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 In Conference Record of the IEEE Photovoltaic Specialists Conference p.2730-2733
Abstract

Electron beam induced current (EBIC) is a well-established tool to, among others, locate and analyze p-n junctions, Schottky contacts or heterostructures in planar devices and is now becoming essential to study and optimize devices at the nanoscale, like III-V nanowire (NW) based solar cells. Here, we report on EBIC measurements on III-V single NW solar cells as well as on fully processed NW devices. This paper also highlights the importance of EBIC to optimize short circuit current density values of fully processed nanowire solar cells of 1 mm2.

Please use this url to cite or link to this publication:
author
; ; ; ; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
series title
Conference Record of the IEEE Photovoltaic Specialists Conference
article number
8980491
pages
4 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
46th IEEE Photovoltaic Specialists Conference, PVSC 2019
conference location
Chicago, United States
conference dates
2019-06-16 - 2019-06-21
external identifiers
  • scopus:85081569571
ISSN
0160-8371
ISBN
9781728104942
DOI
10.1109/PVSC40753.2019.8980491
language
English
LU publication?
yes
id
21b1056a-75af-4230-b407-930ec871f2b8
date added to LUP
2020-03-30 13:35:10
date last changed
2023-10-22 06:19:49
@inproceedings{21b1056a-75af-4230-b407-930ec871f2b8,
  abstract     = {{<p>Electron beam induced current (EBIC) is a well-established tool to, among others, locate and analyze p-n junctions, Schottky contacts or heterostructures in planar devices and is now becoming essential to study and optimize devices at the nanoscale, like III-V nanowire (NW) based solar cells. Here, we report on EBIC measurements on III-V single NW solar cells as well as on fully processed NW devices. This paper also highlights the importance of EBIC to optimize short circuit current density values of fully processed nanowire solar cells of 1 mm<sup>2</sup>.</p>}},
  author       = {{Barrigon, Enrique and Otnes, Gaute and Chen, Yang and Zhang, Yuwei and Hrachowina, Lukas and Zeng, Xulu and Samuelson, Lars and Borgstrom, Magnus}},
  booktitle    = {{2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019}},
  isbn         = {{9781728104942}},
  issn         = {{0160-8371}},
  language     = {{eng}},
  pages        = {{2730--2733}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  series       = {{Conference Record of the IEEE Photovoltaic Specialists Conference}},
  title        = {{Nanoprobe-Enabled Electron Beam Induced Current Measurements on III-V Nanowire-Based Solar Cells}},
  url          = {{http://dx.doi.org/10.1109/PVSC40753.2019.8980491}},
  doi          = {{10.1109/PVSC40753.2019.8980491}},
  year         = {{2019}},
}