Nanoprobe-Enabled Electron Beam Induced Current Measurements on III-V Nanowire-Based Solar Cells
(2019) 46th IEEE Photovoltaic Specialists Conference, PVSC 2019 In Conference Record of the IEEE Photovoltaic Specialists Conference p.2730-2733- Abstract
Electron beam induced current (EBIC) is a well-established tool to, among others, locate and analyze p-n junctions, Schottky contacts or heterostructures in planar devices and is now becoming essential to study and optimize devices at the nanoscale, like III-V nanowire (NW) based solar cells. Here, we report on EBIC measurements on III-V single NW solar cells as well as on fully processed NW devices. This paper also highlights the importance of EBIC to optimize short circuit current density values of fully processed nanowire solar cells of 1 mm2.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/21b1056a-75af-4230-b407-930ec871f2b8
- author
- Barrigon, Enrique LU ; Otnes, Gaute LU ; Chen, Yang LU ; Zhang, Yuwei LU ; Hrachowina, Lukas LU ; Zeng, Xulu LU ; Samuelson, Lars LU and Borgstrom, Magnus LU
- organization
- publishing date
- 2019
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- 2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019
- series title
- Conference Record of the IEEE Photovoltaic Specialists Conference
- article number
- 8980491
- pages
- 4 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- 46th IEEE Photovoltaic Specialists Conference, PVSC 2019
- conference location
- Chicago, United States
- conference dates
- 2019-06-16 - 2019-06-21
- external identifiers
-
- scopus:85081569571
- ISSN
- 0160-8371
- ISBN
- 9781728104942
- DOI
- 10.1109/PVSC40753.2019.8980491
- language
- English
- LU publication?
- yes
- id
- 21b1056a-75af-4230-b407-930ec871f2b8
- date added to LUP
- 2020-03-30 13:35:10
- date last changed
- 2023-10-22 06:19:49
@inproceedings{21b1056a-75af-4230-b407-930ec871f2b8, abstract = {{<p>Electron beam induced current (EBIC) is a well-established tool to, among others, locate and analyze p-n junctions, Schottky contacts or heterostructures in planar devices and is now becoming essential to study and optimize devices at the nanoscale, like III-V nanowire (NW) based solar cells. Here, we report on EBIC measurements on III-V single NW solar cells as well as on fully processed NW devices. This paper also highlights the importance of EBIC to optimize short circuit current density values of fully processed nanowire solar cells of 1 mm<sup>2</sup>.</p>}}, author = {{Barrigon, Enrique and Otnes, Gaute and Chen, Yang and Zhang, Yuwei and Hrachowina, Lukas and Zeng, Xulu and Samuelson, Lars and Borgstrom, Magnus}}, booktitle = {{2019 IEEE 46th Photovoltaic Specialists Conference, PVSC 2019}}, isbn = {{9781728104942}}, issn = {{0160-8371}}, language = {{eng}}, pages = {{2730--2733}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, series = {{Conference Record of the IEEE Photovoltaic Specialists Conference}}, title = {{Nanoprobe-Enabled Electron Beam Induced Current Measurements on III-V Nanowire-Based Solar Cells}}, url = {{http://dx.doi.org/10.1109/PVSC40753.2019.8980491}}, doi = {{10.1109/PVSC40753.2019.8980491}}, year = {{2019}}, }