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On Scan Chain Diagnosis for Intermittent Faults

Adolfsson, Dan; Siew, Joanna; Marinissen, Erik Jan and Larsson, Erik LU (2009) IEEE Asian Test Symposium (ATS) In [Host publication title missing] p.47-54
Abstract
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Scan chain defects constitute a significant fraction of the overall digital defect universe, and hence it is well justified that scan chain diagnosis has received increasing research attention in recent years. In this paper, we address the problem of scan chain diagnosis for intermittent faults. We show that the conventional scan chain test pattern is likely to miss an intermittent fault, or inaccurately diagnose it. We propose an improved scan chain test pattern which we show to be effective. Subsequently, we demonstrate that the conventional bound calculation... (More)
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Scan chain defects constitute a significant fraction of the overall digital defect universe, and hence it is well justified that scan chain diagnosis has received increasing research attention in recent years. In this paper, we address the problem of scan chain diagnosis for intermittent faults. We show that the conventional scan chain test pattern is likely to miss an intermittent fault, or inaccurately diagnose it. We propose an improved scan chain test pattern which we show to be effective. Subsequently, we demonstrate that the conventional bound calculation algorithm is likely to produce wrong results in the case of an intermittent fault. We propose a new lowerbound calculation method which does generate correct and tight bounds, even for an intermittence probability as low as 10%. (Less)
Please use this url to cite or link to this publication:
author
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
[Host publication title missing]
pages
47 - 54
conference name
IEEE Asian Test Symposium (ATS)
external identifiers
  • Scopus:77951193235
DOI
10.1109/ATS.2009.74
language
English
LU publication?
no
id
a1b66e8f-28e5-432b-a32c-a17e741ae833 (old id 2340919)
date added to LUP
2012-02-10 13:47:55
date last changed
2017-01-01 08:14:36
@inproceedings{a1b66e8f-28e5-432b-a32c-a17e741ae833,
  abstract     = {Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Scan chain defects constitute a significant fraction of the overall digital defect universe, and hence it is well justified that scan chain diagnosis has received increasing research attention in recent years. In this paper, we address the problem of scan chain diagnosis for intermittent faults. We show that the conventional scan chain test pattern is likely to miss an intermittent fault, or inaccurately diagnose it. We propose an improved scan chain test pattern which we show to be effective. Subsequently, we demonstrate that the conventional bound calculation algorithm is likely to produce wrong results in the case of an intermittent fault. We propose a new lowerbound calculation method which does generate correct and tight bounds, even for an intermittence probability as low as 10%.},
  author       = {Adolfsson, Dan and Siew, Joanna and Marinissen, Erik Jan and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  language     = {eng},
  pages        = {47--54},
  title        = {On Scan Chain Diagnosis for Intermittent Faults},
  url          = {http://dx.doi.org/10.1109/ATS.2009.74},
  year         = {2009},
}