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- 2015
-
Mark
Abort-on-Fail Test Scheduling for Modular SOCs without and with Preemption
(
- Contribution to journal › Article
- 2009
-
Mark
Deterministic Scan-Chain Diagnosis for Intermittent Faults
2009) European Test Symposium, ETS 2009(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
On Scan Chain Diagnosis for Intermittent Faults
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2007
-
Mark
Improved Scan Chain Diagnosis
2007) 15th NXP IC Test Symposium(
- Contribution to conference › Paper, not in proceeding
-
Mark
Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2006
-
Mark
High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO
2006) 14th Philips Research IC Test Seminar(
- Contribution to conference › Paper, not in proceeding
- 2005
-
Mark
Test Scheduling for Modular SOCs in an Abort-on-Fail Environment
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding