Improved Scan Chain Diagnosis
Marinissen, Erik Jan ; Adolfsson, Dan ; Larsson, Erik LU
and Goel, Sandeep-Kumar
(2007)
15th NXP IC Test Symposium
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2340988
- author
- Marinissen, Erik Jan
; Adolfsson, Dan
; Larsson, Erik
LU
and Goel, Sandeep-Kumar
- publishing date
- 2007
- type
- Contribution to conference
- publication status
- published
- subject
- conference name
- 15th NXP IC Test Symposium
- conference dates
- 0001-01-02
- language
- English
- LU publication?
- no
- id
- 00b2fddb-da7b-415d-8c1f-4f5ec645d7a7 (old id 2340988)
- date added to LUP
- 2016-04-04 14:34:51
- date last changed
- 2018-11-21 21:21:07
@misc{00b2fddb-da7b-415d-8c1f-4f5ec645d7a7,
author = {{Marinissen, Erik Jan and Adolfsson, Dan and Larsson, Erik and Goel, Sandeep-Kumar}},
language = {{eng}},
title = {{Improved Scan Chain Diagnosis}},
year = {{2007}},
}