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Improved Scan Chain Diagnosis

Marinissen, Erik Jan; Adolfsson, Dan; Larsson, Erik LU and Goel, Sandeep-Kumar (2007) 15th NXP IC Test Symposium
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author
publishing date
type
Contribution to conference
publication status
published
subject
conference name
15th NXP IC Test Symposium
language
English
LU publication?
no
id
00b2fddb-da7b-415d-8c1f-4f5ec645d7a7 (old id 2340988)
date added to LUP
2012-02-10 13:41:05
date last changed
2016-06-29 09:01:25
@misc{00b2fddb-da7b-415d-8c1f-4f5ec645d7a7,
  author       = {Marinissen, Erik Jan and Adolfsson, Dan and Larsson, Erik and Goel, Sandeep-Kumar},
  language     = {eng},
  title        = {Improved Scan Chain Diagnosis},
  year         = {2007},
}