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High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO

Dubois, Tobias; Azimane, Mohamed; Larsson, Erik LU ; Marinissen, Erik Jan; Wielage, Paul and Wouters, Clemens (2006) 14th Philips Research IC Test Seminar
Please use this url to cite or link to this publication:
author
publishing date
type
Contribution to conference
publication status
published
subject
keywords
testing, design for testability, embedded systems, FIFO
conference name
14th Philips Research IC Test Seminar
language
English
LU publication?
no
id
44738322-1ea4-48c0-a1b2-787824e6e3f1 (old id 2341038)
date added to LUP
2012-02-10 13:38:55
date last changed
2016-06-29 09:15:35
@misc{44738322-1ea4-48c0-a1b2-787824e6e3f1,
  author       = {Dubois, Tobias and Azimane, Mohamed and Larsson, Erik and Marinissen, Erik Jan and Wielage, Paul and Wouters, Clemens},
  keyword      = {testing,design for testability,embedded systems,FIFO},
  language     = {eng},
  title        = {High-Quality Low-Cost Test and DfT for an Embedded Asynchronous FIFO},
  year         = {2006},
}