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System-on-Chip Test Parallelization Under Power Constraints

Larsson, Erik LU and Peng, Zebo (2001)
Please use this url to cite or link to this publication:
author
publishing date
type
Other contribution
publication status
published
subject
keywords
test parallelization, scan-chain, test conflicts
categories
Popular Science
publisher
European Test Workshop
language
English
LU publication?
no
id
7bb7a95d-ead8-4691-ac0e-2880bbbdbcbf (old id 2341089)
alternative location
http://www.ida.liu.se/labs/eslab/publications/pap/db/ETW01.pdf
date added to LUP
2012-02-10 13:33:37
date last changed
2016-06-29 09:17:19
@misc{7bb7a95d-ead8-4691-ac0e-2880bbbdbcbf,
  author       = {Larsson, Erik and Peng, Zebo},
  keyword      = {test parallelization,scan-chain,test conflicts},
  language     = {eng},
  publisher    = {European Test Workshop},
  title        = {System-on-Chip Test Parallelization Under Power Constraints},
  year         = {2001},
}