System-on-Chip Test Parallelization Under Power Constraints
Larsson, Erik LU
and Peng, Zebo
(2001)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/2341089
- author
- Larsson, Erik
LU
and Peng, Zebo
- publishing date
- 2001
- type
- Other contribution
- publication status
- published
- subject
- keywords
- test parallelization, scan-chain, test conflicts
- categories
- Popular Science
- publisher
- European Test Workshop
- language
- English
- LU publication?
- no
- id
- 7bb7a95d-ead8-4691-ac0e-2880bbbdbcbf (old id 2341089)
- alternative location
- http://www.ida.liu.se/labs/eslab/publications/pap/db/ETW01.pdf
- date added to LUP
- 2016-04-04 11:07:29
- date last changed
- 2018-11-21 21:02:49
@misc{7bb7a95d-ead8-4691-ac0e-2880bbbdbcbf,
author = {{Larsson, Erik and Peng, Zebo}},
keywords = {{test parallelization; scan-chain; test conflicts}},
language = {{eng}},
publisher = {{European Test Workshop}},
title = {{System-on-Chip Test Parallelization Under Power Constraints}},
url = {{http://www.ida.liu.se/labs/eslab/publications/pap/db/ETW01.pdf}},
year = {{2001}},
}