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2003
Mark SOC Test Time Minimization Under Multiple Constraints
Pouget, Julien ; Larsson, Erik ^LU and Peng, Zebo (2003) 12th IEEE Asian Test Symposium ATS 2003 p.312-317
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
Pouget, Julien ; Larsson, Erik ^LU ; Peng, Zebo ; Flottes, Marie-Lise and Rouzeyre, Bruno (2003) IEEE European Test Workshop 2003 ETW03 p.51-56
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Optimal System-on-Chip Test Scheduling
Larsson, Erik ^LU and Fujiwara, Hideo (2003) 12th IEEE Asian Test Symposium ATS03 p.306-311
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2002
Mark Integrated Test Scheduling, Test Parallelization and TAM Design
Larsson, Erik ^LU ; Arvidsson, Klas ; Fujiwara, Hideo and Peng, Zebo (2002) IEEE Asian Test Symposium ATS02 p.397-404
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2001
Mark The Design and Optimization of SOC Test Solutions
Larsson, Erik ^LU ; Peng, Zebo and Carlsson, Gunnar (2001) IEEE/ACM International Conference on Computer Aided Design, ICCAD 2001 p.523-530
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark System-on-Chip Test Parallelization Under Power Constraints
Larsson, Erik ^LU and Peng, Zebo (2001)
- Other contribution › Miscellaneous