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- 2005
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Mark
Abort-on-Fail Based Test Scheduling
(
- Contribution to journal › Article
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Mark
Multiple Constraints Driven System-on-Chip Test Time Optimization
(
- Contribution to journal › Article
- 2004
-
Mark
Defect-Aware SOC Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2003
-
Mark
SOC Test Time Minimization Under Multiple Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
System-on-Chip Test Scheduling based on Defect Probability
2003)(
- Other contribution › Miscellaneous
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Mark
Defect Probability-based System-On-Chip Test Scheduling
2003) 6th IEEE International Workshop on Design and Diagnostics of Electronics Circuits and Systems DDECS 03,2003 p.25-32(
- Contribution to conference › Paper, not in proceeding
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Mark
An Efficient Approach to SoC Wrapper Design, TAM Configuration and Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding