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Nanoscale 3-D (E, k(x), k(y)) band structure imaging on graphene and intercalated graphene

Zakharov, Alexei LU ; Virojanadara, C.; Watcharinyanon, S.; Yakimova, R. and Johansson, L. I. (2011) In IBM Journal of Research and Development 55(4). p.1-6
Abstract
An x-ray photoemission electron microscope (X-PEEM) equipped with a hemispherical energy analyzer is capable of fast acquisition of momentum-resolved photoelectron angular distribution patterns in a complete cone. We have applied this technique to observe the 3-D (E, k(x), k(y)) electronic band structure of zero-, one-, and two-monolayer (ML) graphene grown ex situ on 6H-SiC(0001) substrates where a carbon buffer layer (zero ML) forms underneath the graphene layer(s). We demonstrate that the interfacial buffer layer can be converted into quasi-free-standing graphene upon intercalation of Li atoms at the interface and that such a graphene is structurally and electronically decoupled from the SiC substrate. High energy and momentum... (More)
An x-ray photoemission electron microscope (X-PEEM) equipped with a hemispherical energy analyzer is capable of fast acquisition of momentum-resolved photoelectron angular distribution patterns in a complete cone. We have applied this technique to observe the 3-D (E, k(x), k(y)) electronic band structure of zero-, one-, and two-monolayer (ML) graphene grown ex situ on 6H-SiC(0001) substrates where a carbon buffer layer (zero ML) forms underneath the graphene layer(s). We demonstrate that the interfacial buffer layer can be converted into quasi-free-standing graphene upon intercalation of Li atoms at the interface and that such a graphene is structurally and electronically decoupled from the SiC substrate. High energy and momentum resolution of the X-PEEM, along with short data acquisition times from submicrometer areas on the surface demonstrates the uniqueness and the versatility of the technique and broadens its impact and applicability within surface science and nanotechnology. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
IBM Journal of Research and Development
volume
55
issue
4
pages
1 - 6
publisher
IBM Corp
external identifiers
  • wos:000301500600008
  • scopus:81255209959
ISSN
2151-8556
DOI
10.1147/JRD.2011.2143570
language
English
LU publication?
yes
id
0336a365-dbf3-40c5-a8e0-e9de241007e2 (old id 2493655)
date added to LUP
2012-05-11 15:23:51
date last changed
2017-02-19 03:16:51
@article{0336a365-dbf3-40c5-a8e0-e9de241007e2,
  abstract     = {An x-ray photoemission electron microscope (X-PEEM) equipped with a hemispherical energy analyzer is capable of fast acquisition of momentum-resolved photoelectron angular distribution patterns in a complete cone. We have applied this technique to observe the 3-D (E, k(x), k(y)) electronic band structure of zero-, one-, and two-monolayer (ML) graphene grown ex situ on 6H-SiC(0001) substrates where a carbon buffer layer (zero ML) forms underneath the graphene layer(s). We demonstrate that the interfacial buffer layer can be converted into quasi-free-standing graphene upon intercalation of Li atoms at the interface and that such a graphene is structurally and electronically decoupled from the SiC substrate. High energy and momentum resolution of the X-PEEM, along with short data acquisition times from submicrometer areas on the surface demonstrates the uniqueness and the versatility of the technique and broadens its impact and applicability within surface science and nanotechnology.},
  author       = {Zakharov, Alexei and Virojanadara, C. and Watcharinyanon, S. and Yakimova, R. and Johansson, L. I.},
  issn         = {2151-8556},
  language     = {eng},
  number       = {4},
  pages        = {1--6},
  publisher    = {IBM Corp},
  series       = {IBM Journal of Research and Development},
  title        = {Nanoscale 3-D (E, k(x), k(y)) band structure imaging on graphene and intercalated graphene},
  url          = {http://dx.doi.org/10.1147/JRD.2011.2143570},
  volume       = {55},
  year         = {2011},
}