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Characterizing the geometry of InAs nanowires using mirror electron microscopy

Kennedy, S. M.; Hjort, Martin LU ; Mandl, B.; Mårsell, Erik LU ; Zakharov, Alexei LU ; Mikkelsen, Anders LU ; Paganin, D. M. and Jesson, D. E. (2012) In Nanotechnology 23(12).
Abstract
Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Nanotechnology
volume
23
issue
12
publisher
IOP Publishing
external identifiers
  • wos:000301662400012
  • scopus:84858425217
ISSN
0957-4484
DOI
10.1088/0957-4484/23/12/125703
language
English
LU publication?
yes
id
793a5a7c-1360-4d39-8004-9a33e4cc8d60 (old id 2495020)
date added to LUP
2012-05-10 12:51:35
date last changed
2017-01-01 03:09:58
@article{793a5a7c-1360-4d39-8004-9a33e4cc8d60,
  abstract     = {Mirror electron microscopy (MEM) imaging of InAs nanowires is a non-destructive electron microscopy technique where the electrons are reflected via an applied electric field before they reach the specimen surface. However strong caustic features are observed that can be non-intuitive and difficult to relate to nanowire geometry and composition. Utilizing caustic imaging theory we can understand and interpret MEM image contrast, relating caustic image features to the properties and parameters of the nanowire. This is applied to obtain quantitative information, including the nanowire width via a through-focus series of MEM images.},
  articleno    = {125703},
  author       = {Kennedy, S. M. and Hjort, Martin and Mandl, B. and Mårsell, Erik and Zakharov, Alexei and Mikkelsen, Anders and Paganin, D. M. and Jesson, D. E.},
  issn         = {0957-4484},
  language     = {eng},
  number       = {12},
  publisher    = {IOP Publishing},
  series       = {Nanotechnology},
  title        = {Characterizing the geometry of InAs nanowires using mirror electron microscopy},
  url          = {http://dx.doi.org/10.1088/0957-4484/23/12/125703},
  volume       = {23},
  year         = {2012},
}