THz Spectroscopic Electron Paramagnetic Resonance of the Fe3+Defect in GaN
(2023) 48th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2023 In International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz- Abstract
We present a recently developed method for electron paramagnetic resonance (EPR) measurements in the THz spectral range. The method is based on spectroscopic ellipsometry and thus requires no cavity, unlike conventional EPR. This permits us to scan the frequency parameters in addition to the magnetic field parameters. To showcase this, both frequency and magnetic field scans are performed on Fe-doped GaN, and the results are compared to previous work that used conventional EPR to study the same defect.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/293cc0f2-8f52-45e9-ad33-fc9f42e0a142
- author
- Rindert, Viktor LU ; Richter, Steffen LU ; Knight, Sean LU ; Schubert, Mathias LU and Darakchieva, Vanya LU
- organization
- publishing date
- 2023
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- IRMMW-THz 2023 - 48th Conference on Infrared, Millimeter, and Terahertz Waves
- series title
- International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
- publisher
- IEEE Computer Society
- conference name
- 48th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2023
- conference location
- Montreal, Canada
- conference dates
- 2023-09-17 - 2023-09-22
- external identifiers
-
- scopus:85177670969
- ISSN
- 2162-2035
- 2162-2027
- ISBN
- 9798350336603
- DOI
- 10.1109/IRMMW-THz57677.2023.10299078
- language
- English
- LU publication?
- yes
- id
- 293cc0f2-8f52-45e9-ad33-fc9f42e0a142
- date added to LUP
- 2024-01-09 12:16:38
- date last changed
- 2024-04-24 08:11:30
@inproceedings{293cc0f2-8f52-45e9-ad33-fc9f42e0a142, abstract = {{<p>We present a recently developed method for electron paramagnetic resonance (EPR) measurements in the THz spectral range. The method is based on spectroscopic ellipsometry and thus requires no cavity, unlike conventional EPR. This permits us to scan the frequency parameters in addition to the magnetic field parameters. To showcase this, both frequency and magnetic field scans are performed on Fe-doped GaN, and the results are compared to previous work that used conventional EPR to study the same defect.</p>}}, author = {{Rindert, Viktor and Richter, Steffen and Knight, Sean and Schubert, Mathias and Darakchieva, Vanya}}, booktitle = {{IRMMW-THz 2023 - 48th Conference on Infrared, Millimeter, and Terahertz Waves}}, isbn = {{9798350336603}}, issn = {{2162-2035}}, language = {{eng}}, publisher = {{IEEE Computer Society}}, series = {{International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz}}, title = {{THz Spectroscopic Electron Paramagnetic Resonance of the Fe<sup>3+</sup>Defect in GaN}}, url = {{http://dx.doi.org/10.1109/IRMMW-THz57677.2023.10299078}}, doi = {{10.1109/IRMMW-THz57677.2023.10299078}}, year = {{2023}}, }