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THz Spectroscopic Electron Paramagnetic Resonance of the Fe3+Defect in GaN

Rindert, Viktor LU orcid ; Richter, Steffen LU ; Knight, Sean LU ; Schubert, Mathias LU orcid and Darakchieva, Vanya LU (2023) 48th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2023 In International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Abstract

We present a recently developed method for electron paramagnetic resonance (EPR) measurements in the THz spectral range. The method is based on spectroscopic ellipsometry and thus requires no cavity, unlike conventional EPR. This permits us to scan the frequency parameters in addition to the magnetic field parameters. To showcase this, both frequency and magnetic field scans are performed on Fe-doped GaN, and the results are compared to previous work that used conventional EPR to study the same defect.

Please use this url to cite or link to this publication:
author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
IRMMW-THz 2023 - 48th Conference on Infrared, Millimeter, and Terahertz Waves
series title
International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
publisher
IEEE Computer Society
conference name
48th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2023
conference location
Montreal, Canada
conference dates
2023-09-17 - 2023-09-22
external identifiers
  • scopus:85177670969
ISSN
2162-2035
2162-2027
ISBN
9798350336603
DOI
10.1109/IRMMW-THz57677.2023.10299078
language
English
LU publication?
yes
id
293cc0f2-8f52-45e9-ad33-fc9f42e0a142
date added to LUP
2024-01-09 12:16:38
date last changed
2024-04-24 08:11:30
@inproceedings{293cc0f2-8f52-45e9-ad33-fc9f42e0a142,
  abstract     = {{<p>We present a recently developed method for electron paramagnetic resonance (EPR) measurements in the THz spectral range. The method is based on spectroscopic ellipsometry and thus requires no cavity, unlike conventional EPR. This permits us to scan the frequency parameters in addition to the magnetic field parameters. To showcase this, both frequency and magnetic field scans are performed on Fe-doped GaN, and the results are compared to previous work that used conventional EPR to study the same defect.</p>}},
  author       = {{Rindert, Viktor and Richter, Steffen and Knight, Sean and Schubert, Mathias and Darakchieva, Vanya}},
  booktitle    = {{IRMMW-THz 2023 - 48th Conference on Infrared, Millimeter, and Terahertz Waves}},
  isbn         = {{9798350336603}},
  issn         = {{2162-2035}},
  language     = {{eng}},
  publisher    = {{IEEE Computer Society}},
  series       = {{International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz}},
  title        = {{THz Spectroscopic Electron Paramagnetic Resonance of the Fe<sup>3+</sup>Defect in GaN}},
  url          = {{http://dx.doi.org/10.1109/IRMMW-THz57677.2023.10299078}},
  doi          = {{10.1109/IRMMW-THz57677.2023.10299078}},
  year         = {{2023}},
}