Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging
(2021) In Journal of Synchrotron Radiation 28. p.1573-1582- Abstract
Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10... (More)
Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices.
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- author
- Soltau, Jakob ; Chayanun, Lert LU ; Lyubomirskiy, Mikhail ; Wallentin, Jesper LU and Osterhoff, Markus
- organization
- publishing date
- 2021-09-01
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- multilayer zone plates, X-ray beam induced current, X-ray imaging, X-ray optic, XBIC mapping
- in
- Journal of Synchrotron Radiation
- volume
- 28
- pages
- 10 pages
- publisher
- International Union of Crystallography
- external identifiers
-
- scopus:85114438480
- pmid:34475304
- ISSN
- 0909-0495
- DOI
- 10.1107/S1600577521006159
- language
- English
- LU publication?
- yes
- additional info
- Funding Information: This project was funded by the Röntgen Ångström Cluster, grant number 2015-06125, by Deutsche Forschungsge-meinschaft, grant number SFB 755, by Bundesministerium für Bildung und Forschung, grant number 05K19MG2, as well as the Olle Engkvist foundation, NanoLund, and Marie Sklo-dowska Curie Actions Cofund, Project INCA 600398. This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No 801847). Funding Information: This project was funded by the R?ntgen A?ngstr?m Cluster, grant number 2015-06125, by Deutsche Forschungsgemeinschaft, grant number SFB 755, by Bundesministerium f?r Bildung und Forschung, grant number 05K19MG2, as well as the Olle Engkvist foundation, NanoLund, and Marie Sklodowska Curie Actions Cofund, Project INCA 600398. This project has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation program (grant agreement No 801847). Publisher Copyright: © 2021 International Union of Crystallography. All rights reserved. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.
- id
- 2da0a49e-fe3c-44aa-95b7-01e2c6f0f5c9
- date added to LUP
- 2021-09-16 07:59:27
- date last changed
- 2024-09-22 01:19:27
@article{2da0a49e-fe3c-44aa-95b7-01e2c6f0f5c9, abstract = {{<p>Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices.</p>}}, author = {{Soltau, Jakob and Chayanun, Lert and Lyubomirskiy, Mikhail and Wallentin, Jesper and Osterhoff, Markus}}, issn = {{0909-0495}}, keywords = {{multilayer zone plates; X-ray beam induced current; X-ray imaging; X-ray optic; XBIC mapping}}, language = {{eng}}, month = {{09}}, pages = {{1573--1582}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Synchrotron Radiation}}, title = {{Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging}}, url = {{http://dx.doi.org/10.1107/S1600577521006159}}, doi = {{10.1107/S1600577521006159}}, volume = {{28}}, year = {{2021}}, }