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Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging

Soltau, Jakob ; Chayanun, Lert LU ; Lyubomirskiy, Mikhail ; Wallentin, Jesper LU and Osterhoff, Markus (2021) In Journal of Synchrotron Radiation 28. p.1573-1582
Abstract

Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10... (More)

Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
multilayer zone plates, X-ray beam induced current, X-ray imaging, X-ray optic, XBIC mapping
in
Journal of Synchrotron Radiation
volume
28
pages
10 pages
publisher
International Union of Crystallography
external identifiers
  • scopus:85114438480
  • pmid:34475304
ISSN
0909-0495
DOI
10.1107/S1600577521006159
language
English
LU publication?
yes
additional info
Funding Information: This project was funded by the Röntgen Ångström Cluster, grant number 2015-06125, by Deutsche Forschungsge-meinschaft, grant number SFB 755, by Bundesministerium für Bildung und Forschung, grant number 05K19MG2, as well as the Olle Engkvist foundation, NanoLund, and Marie Sklo-dowska Curie Actions Cofund, Project INCA 600398. This project has received funding from the European Research Council (ERC) under the European Union’s Horizon 2020 research and innovation program (grant agreement No 801847). Funding Information: This project was funded by the R?ntgen A?ngstr?m Cluster, grant number 2015-06125, by Deutsche Forschungsgemeinschaft, grant number SFB 755, by Bundesministerium f?r Bildung und Forschung, grant number 05K19MG2, as well as the Olle Engkvist foundation, NanoLund, and Marie Sklodowska Curie Actions Cofund, Project INCA 600398. This project has received funding from the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation program (grant agreement No 801847). Publisher Copyright: © 2021 International Union of Crystallography. All rights reserved. Copyright: Copyright 2021 Elsevier B.V., All rights reserved.
id
2da0a49e-fe3c-44aa-95b7-01e2c6f0f5c9
date added to LUP
2021-09-16 07:59:27
date last changed
2024-06-15 16:18:28
@article{2da0a49e-fe3c-44aa-95b7-01e2c6f0f5c9,
  abstract     = {{<p>Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices.</p>}},
  author       = {{Soltau, Jakob and Chayanun, Lert and Lyubomirskiy, Mikhail and Wallentin, Jesper and Osterhoff, Markus}},
  issn         = {{0909-0495}},
  keywords     = {{multilayer zone plates; X-ray beam induced current; X-ray imaging; X-ray optic; XBIC mapping}},
  language     = {{eng}},
  month        = {{09}},
  pages        = {{1573--1582}},
  publisher    = {{International Union of Crystallography}},
  series       = {{Journal of Synchrotron Radiation}},
  title        = {{Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging}},
  url          = {{http://dx.doi.org/10.1107/S1600577521006159}},
  doi          = {{10.1107/S1600577521006159}},
  volume       = {{28}},
  year         = {{2021}},
}