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2022
Mark Multi-beam X-ray ptychography using coded probes for rapid non-destructive high resolution imaging of extended samples
Lyubomirskiy, Mikhail ; Wittwer, Felix ; Kahnt, Maik ^LU ; Koch, Frieder ; Kubec, Adam ; Falch, Ken Vidar ; Garrevoet, Jan ; Seyrich, Martin ; David, Christian and Schroer, Christian G. (2022) In Scientific Reports 12(1).
- Contribution to journal › Article
Mark Evolution of Hierarchically Porous Nickel Alumina Catalysts Studied by X-Ray Ptychography
Weber, Sebastian ; Diaz, Ana ; Holler, Mirko ; Schropp, Andreas ; Lyubomirskiy, Mikhail ; Abel, Ken L. ; Kahnt, Maik ^LU ; Jeromin, Arno ; Kulkarni, Satishkumar and Keller, Thomas F. , et al. (2022) In Advanced science (Weinheim, Baden-Wurttemberg, Germany) 9(8). p.2105432-2105432
- Contribution to journal › Article
2021
Mark Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging
Soltau, Jakob ; Chayanun, Lert ^LU ; Lyubomirskiy, Mikhail ; Wallentin, Jesper ^LU and Osterhoff, Markus (2021) In Journal of Synchrotron Radiation 28. p.1573-1582
- Contribution to journal › Article
Mark Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view
Wittwer, Felix ; Lyubomirskiy, Mikhail ; Koch, Frieder ; Kahnt, Maik ^LU ; Seyrich, Martin ; Garrevoet, Jan ; David, Christian and Schroer, Christian G. (2021) In Applied Physics Letters 118(17).
- Contribution to journal › Article
Mark Planar refractive lenses made of SiC for high intensity nanofocusing
Lyubomirskiy, Mikhail ; Schurink, Bart ; Makhotkin, Igor A. ; Brueckner, Dennis ; Wittwer, Felix ; Kahnt, Maik ^LU ; Seyrich, Martin ; Seiboth, Frank ; Bijkerk, Fred and Schroer, Christian G. (2021) In Optics Express 29(9). p.14025-14032
- Contribution to journal › Article
2020
Mark Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Seiboth, Frank ; Brückner, Dennis ; Kahnt, Maik ^LU ; Lyubomirskiy, Mikhail ; Wittwer, Felix ; Dzhigaev, Dmitry ^LU ; Ullsperger, Tobias ; Nolte, Stefan ; Koch, Frieder and David, Christian , et al. (2020) In Journal of Synchrotron Radiation 27. p.1121-1130
- Contribution to journal › Article
Mark PtyNAMi : Ptychographic nano-analytical microscope
Schropp, Andreas ; Dohrmann, Ralph ; Botta, Stephan ; Bruckner, Dennis ; Kahnt, Maik ^LU ; Lyubomirskiy, Mikhail ; Ossig, Christina ; Scholz, Maria ; Seyrich, Martin and Stuckelberger, Michael E. , et al. (2020) In Journal of Applied Crystallography 53. p.957-971
- Contribution to journal › Article
2019
Mark Refractive hard x-ray vortex phase plates
Seiboth, Frank ; Kahnt, Maik ^LU ; Lyubomirskiy, Mikhail ; Seyrich, Martin ; Wittwer, Felix ; Ullsperger, Tobias ; Nolte, Stefan ; Batey, Darren ; Rau, Christoph and Schroer, Christian G. (2019) In Optics Letters 44(18). p.4622-4625
- Contribution to journal › Article
Mark Mapping the Pore Architecture of Structured Catalyst Monoliths from Nanometer to Centimeter Scale with Electron and X-ray Tomographies
Becher, Johannes ; Sheppard, Thomas L. ; Fam, Yakub ; Baier, Sina ; Wang, Wu ; Wang, Di ; Kulkarni, Satishkumar ; Keller, Thomas F. ; Lyubomirskiy, Mikhail and Brueckner, Dennis , et al. (2019) In Journal of Physical Chemistry C 123(41). p.25197-25208
- Contribution to journal › Article
2017
Mark PtyNAMi : Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector
Schroer, Christian G. ; Seyrich, Martin ; Kahnt, Maik ^LU ; Botta, Stephan ; Döhrmann, Ralph ; Falkenberg, Gerald ; Garrevoet, Jan ; Lyubomirskiy, Mikhail ; Scholz, Maria and Schropp, Andreas , et al. (2017) X-Ray Nanoimaging: Instruments and Methods III 2017 10389.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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