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- 2019
-
Refractive hard x-ray vortex phase plates
Seiboth, Frank ; Kahnt, Maik LU
;
Lyubomirskiy, Mikhail
;
Seyrich, Martin
;
Wittwer, Felix
;
Ullsperger, Tobias
;
Nolte, Stefan
;
Batey, Darren
;
Rau, Christoph
and
Schroer, Christian G.
(2019)
In Optics Letters
44(18).
p.4622-4625
Mark
-
Coupled ptychography and tomography algorithm improves reconstruction of experimental data
Kahnt, Maik LU
;
Becher, Johannes
;
Brückner, Dennis
;
Fam, Yakub
;
Sheppard, Thomas
;
Weissenberger, Tobias
;
Wittwer, Felix
;
Grunwaldt, Jan Dierk
;
Schwieger, Wilhelm
and
Schroer, Christian G.
(2019)
In Optica
6(10).
p.1282-1289
Mark
-
Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity
Schroer, Christian G. ; Seyrich, Martin ; Schropp, Andreas ; Döhrmann, Ralph ; Botta, Stephan ; Wiljes, Patrik ; Brückner, Dennis ; Kahnt, Maik LU
;
Wittwer, Felix
and
Grote, Lukas
, et al.
(2019)
X-Ray Nanoimaging: Instruments and Methods IV 2019
In Proceedings of SPIE - The International Society for Optical Engineering
11112.
Mark
- A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science
- 2018
-
Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses
Seiboth, Frank ; Wittwer, Felix ; Scholz, Maria ; Kahnt, Maik LU
;
Seyrich, Martin
;
Schropp, Andreas
;
Wagner, Ulrich
;
Rau, Christoph
;
Garrevoet, Jan
and
Falkenberg, Gerald
, et al.
(2018)
In Journal of Synchrotron Radiation
25(1).
p.108-115
Mark
- 2017
-
PtyNAMi : Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector
Schroer, Christian G. ; Seyrich, Martin ; Kahnt, Maik LU
;
Botta, Stephan
;
Döhrmann, Ralph
;
Falkenberg, Gerald
;
Garrevoet, Jan
;
Lyubomirskiy, Mikhail
;
Scholz, Maria
and
Schropp, Andreas
, et al.
(2017)
X-Ray Nanoimaging: Instruments and Methods III 2017
10389.
Mark
- 2016
-
Quantitative characterization of aberrations in x-ray optics
Seiboth, Frank ; Kahnt, Maik LU
;
Scholz, Maria
;
Seyrich, Martin
;
Wittwer, Felix
;
Garrevoet, Jan
;
Falkenberg, Gerald
;
Schropp, Andreas
and
Schroer, Christian G.
(2016)
Conferene on Advances in X-Ray/EUV Optics and Components XI
9963.
Mark