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- 2020
-
Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques
Seiboth, Frank ; Brückner, Dennis ; Kahnt, Maik LU
; Lyubomirskiy, Mikhail
; Wittwer, Felix
; Dzhigaev, Dmitry
LU
; Ullsperger, Tobias
; Nolte, Stefan
; Koch, Frieder
and David, Christian
, et al.
(2020)
In Journal of Synchrotron Radiation
27.
p.1121-1130
Mark
-
PtyNAMi : Ptychographic nano-analytical microscope
Schropp, Andreas ; Dohrmann, Ralph ; Botta, Stephan ; Bruckner, Dennis ; Kahnt, Maik LU
; Lyubomirskiy, Mikhail
; Ossig, Christina
; Scholz, Maria
; Seyrich, Martin
and Stuckelberger, Michael E.
, et al.
(2020)
In Journal of Applied Crystallography
53.
p.957-971
Mark
- 2019
-
Refractive hard x-ray vortex phase plates
Seiboth, Frank ; Kahnt, Maik LU
; Lyubomirskiy, Mikhail
; Seyrich, Martin
; Wittwer, Felix
; Ullsperger, Tobias
; Nolte, Stefan
; Batey, Darren
; Rau, Christoph
and Schroer, Christian G.
(2019)
In Optics Letters
44(18).
p.4622-4625
Mark
-
Coupled ptychography and tomography algorithm improves reconstruction of experimental data
Kahnt, Maik LU
; Becher, Johannes
; Brückner, Dennis
; Fam, Yakub
; Sheppard, Thomas
; Weissenberger, Tobias
; Wittwer, Felix
; Grunwaldt, Jan Dierk
; Schwieger, Wilhelm
and Schroer, Christian G.
(2019)
In Optica
6(10).
p.1282-1289
Mark
-
Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity
Schroer, Christian G. ; Seyrich, Martin ; Schropp, Andreas ; Döhrmann, Ralph ; Botta, Stephan ; Wiljes, Patrik ; Brückner, Dennis ; Kahnt, Maik LU
; Wittwer, Felix
and Grote, Lukas
, et al.
(2019)
X-Ray Nanoimaging: Instruments and Methods IV 2019
In Proceedings of SPIE - The International Society for Optical Engineering
11112.
Mark
- A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science
- 2018
-
Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses
Seiboth, Frank ; Wittwer, Felix ; Scholz, Maria ; Kahnt, Maik LU
; Seyrich, Martin
; Schropp, Andreas
; Wagner, Ulrich
; Rau, Christoph
; Garrevoet, Jan
and Falkenberg, Gerald
, et al.
(2018)
In Journal of Synchrotron Radiation
25(1).
p.108-115
Mark
- 2017
-
PtyNAMi : Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector
Schroer, Christian G. ; Seyrich, Martin ; Kahnt, Maik LU
; Botta, Stephan
; Döhrmann, Ralph
; Falkenberg, Gerald
; Garrevoet, Jan
; Lyubomirskiy, Mikhail
; Scholz, Maria
and Schropp, Andreas
, et al.
(2017)
X-Ray Nanoimaging: Instruments and Methods III 2017
10389.
Mark
- 2016
-
Quantitative characterization of aberrations in x-ray optics
Seiboth, Frank ; Kahnt, Maik LU
; Scholz, Maria
; Seyrich, Martin
; Wittwer, Felix
; Garrevoet, Jan
; Falkenberg, Gerald
; Schropp, Andreas
and Schroer, Christian G.
(2016)
Conferene on Advances in X-Ray/EUV Optics and Components XI
9963.
Mark