Skip to main content

Lund University Publications

LUND UNIVERSITY LIBRARIES

Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity

Schroer, Christian G. ; Seyrich, Martin ; Schropp, Andreas ; Döhrmann, Ralph ; Botta, Stephan ; Wiljes, Patrik ; Brückner, Dennis ; Kahnt, Maik LU orcid ; Wittwer, Felix and Grote, Lukas , et al. (2019) X-Ray Nanoimaging: Instruments and Methods IV 2019 In Proceedings of SPIE - The International Society for Optical Engineering 11112.
Abstract

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small... (More)

The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.

(Less)
Please use this url to cite or link to this publication:
author
; ; ; ; ; ; ; ; and , et al. (More)
; ; ; ; ; ; ; ; ; ; ; and (Less)
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
keywords
Detection sensitivity, Ptychography, Signal-to-background ratio, Spatial resolution, Tomography, X-ray microscopy
host publication
X-Ray Nanoimaging : Instruments and Methods IV - Instruments and Methods IV
series title
Proceedings of SPIE - The International Society for Optical Engineering
editor
Lai, Barry and Somogyi, Andrea
volume
11112
article number
111120D
publisher
SPIE
conference name
X-Ray Nanoimaging: Instruments and Methods IV 2019
conference location
San Diego, United States
conference dates
2019-08-11 - 2019-08-12
external identifiers
  • scopus:85076544214
ISSN
1996-756X
0277-786X
ISBN
9781510629172
DOI
10.1117/12.2529096
language
English
LU publication?
no
id
226f0b16-c543-4e19-a1ae-02f572f56b62
date added to LUP
2019-12-29 11:44:34
date last changed
2024-06-26 07:45:11
@inproceedings{226f0b16-c543-4e19-a1ae-02f572f56b62,
  abstract     = {{<p>The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.</p>}},
  author       = {{Schroer, Christian G. and Seyrich, Martin and Schropp, Andreas and Döhrmann, Ralph and Botta, Stephan and Wiljes, Patrik and Brückner, Dennis and Kahnt, Maik and Wittwer, Felix and Grote, Lukas and Koziej, Dorota and Garrevoet, Jan and Falkenberg, Gerald}},
  booktitle    = {{X-Ray Nanoimaging : Instruments and Methods IV}},
  editor       = {{Lai, Barry and Somogyi, Andrea}},
  isbn         = {{9781510629172}},
  issn         = {{1996-756X}},
  keywords     = {{Detection sensitivity; Ptychography; Signal-to-background ratio; Spatial resolution; Tomography; X-ray microscopy}},
  language     = {{eng}},
  month        = {{01}},
  publisher    = {{SPIE}},
  series       = {{Proceedings of SPIE - The International Society for Optical Engineering}},
  title        = {{Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity}},
  url          = {{http://dx.doi.org/10.1117/12.2529096}},
  doi          = {{10.1117/12.2529096}},
  volume       = {{11112}},
  year         = {{2019}},
}