Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity
(2019) X-Ray Nanoimaging: Instruments and Methods IV 2019 In Proceedings of SPIE - The International Society for Optical Engineering 11112.- Abstract
The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small... (More)
The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.
(Less)
- author
- publishing date
- 2019-01-01
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- keywords
- Detection sensitivity, Ptychography, Signal-to-background ratio, Spatial resolution, Tomography, X-ray microscopy
- host publication
- X-Ray Nanoimaging : Instruments and Methods IV - Instruments and Methods IV
- series title
- Proceedings of SPIE - The International Society for Optical Engineering
- editor
- Lai, Barry and Somogyi, Andrea
- volume
- 11112
- article number
- 111120D
- publisher
- SPIE
- conference name
- X-Ray Nanoimaging: Instruments and Methods IV 2019
- conference location
- San Diego, United States
- conference dates
- 2019-08-11 - 2019-08-12
- external identifiers
-
- scopus:85076544214
- ISSN
- 0277-786X
- 1996-756X
- ISBN
- 9781510629172
- DOI
- 10.1117/12.2529096
- language
- English
- LU publication?
- no
- id
- 226f0b16-c543-4e19-a1ae-02f572f56b62
- date added to LUP
- 2019-12-29 11:44:34
- date last changed
- 2024-09-18 15:20:22
@inproceedings{226f0b16-c543-4e19-a1ae-02f572f56b62, abstract = {{<p>The X-ray scanning microscope PtyNAMi at beamline P06 of PETRA III at DESY in Hamburg, Germany, is designed for high-spatial-resolution 3D imaging with high sensitivity. Besides optimizing the coherent ux density on the sample and the precision mechanics of the scanner, special care has been taken to reduce background signals on the detector. The optical path behind the sample is evacuated up until the sensor of a four-megapixel detector that is placed into the vacuum. In this way, parasitic scattering from air and windows close to the detector is avoided. The instrument has been commissioned and is in user operation. The main commissioning results of the low-background detector system are presented. A signal-to-noise model for small object details is derived that includes incoherent background scattering.</p>}}, author = {{Schroer, Christian G. and Seyrich, Martin and Schropp, Andreas and Döhrmann, Ralph and Botta, Stephan and Wiljes, Patrik and Brückner, Dennis and Kahnt, Maik and Wittwer, Felix and Grote, Lukas and Koziej, Dorota and Garrevoet, Jan and Falkenberg, Gerald}}, booktitle = {{X-Ray Nanoimaging : Instruments and Methods IV}}, editor = {{Lai, Barry and Somogyi, Andrea}}, isbn = {{9781510629172}}, issn = {{0277-786X}}, keywords = {{Detection sensitivity; Ptychography; Signal-to-background ratio; Spatial resolution; Tomography; X-ray microscopy}}, language = {{eng}}, month = {{01}}, publisher = {{SPIE}}, series = {{Proceedings of SPIE - The International Society for Optical Engineering}}, title = {{Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity}}, url = {{http://dx.doi.org/10.1117/12.2529096}}, doi = {{10.1117/12.2529096}}, volume = {{11112}}, year = {{2019}}, }