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2022
Mark Evolution of Hierarchically Porous Nickel Alumina Catalysts Studied by X-Ray Ptychography
Weber, Sebastian ; Diaz, Ana ; Holler, Mirko ; Schropp, Andreas ; Lyubomirskiy, Mikhail ; Abel, Ken L. ; Kahnt, Maik ^LU ; Jeromin, Arno ; Kulkarni, Satishkumar and Keller, Thomas F. , et al. (2022) In Advanced science (Weinheim, Baden-Wurttemberg, Germany) 9(8). p.2105432-2105432
- Contribution to journal › Article
2020
Mark Tomographic reconstruction with a generative adversarial network
Yang, Xiaogang ; Kahnt, Maik ^LU ; Bruckner, Dennis ; Schropp, Andreas ; Fam, Yakub ; Becher, Johannes ; Grunwaldt, Jan Dierk ; Sheppard, Thomas L. and Schroer, Christian G. (2020) In Journal of Synchrotron Radiation 27. p.486-493
- Contribution to journal › Article
Mark PtyNAMi : Ptychographic nano-analytical microscope
Schropp, Andreas ; Dohrmann, Ralph ; Botta, Stephan ; Bruckner, Dennis ; Kahnt, Maik ^LU ; Lyubomirskiy, Mikhail ; Ossig, Christina ; Scholz, Maria ; Seyrich, Martin and Stuckelberger, Michael E. , et al. (2020) In Journal of Applied Crystallography 53. p.957-971
- Contribution to journal › Article
2019
Mark Ptychographic Nano-Analytical Microscope (PtyNAMi) at PETRA III : Signal-to-background optimization for imaging with high sensitivity
Schroer, Christian G. ; Seyrich, Martin ; Schropp, Andreas ; Döhrmann, Ralph ; Botta, Stephan ; Wiljes, Patrik ; Brückner, Dennis ; Kahnt, Maik ^LU ; Wittwer, Felix and Grote, Lukas , et al. (2019) X-Ray Nanoimaging: Instruments and Methods IV 2019 In Proceedings of SPIE - The International Society for Optical Engineering 11112.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Mapping the Pore Architecture of Structured Catalyst Monoliths from Nanometer to Centimeter Scale with Electron and X-ray Tomographies
Becher, Johannes ; Sheppard, Thomas L. ; Fam, Yakub ; Baier, Sina ; Wang, Wu ; Wang, Di ; Kulkarni, Satishkumar ; Keller, Thomas F. ; Lyubomirskiy, Mikhail and Brueckner, Dennis , et al. (2019) In Journal of Physical Chemistry C 123(41). p.25197-25208
- Contribution to journal › Article
Mark A versatile nanoreactor for complementary in situ X-ray and electron microscopy studies in catalysis and materials science
Fam, Yakub ; Sheppard, Thomas L. ; Becher, Johannes ; Scherhaufer, Dennis ; Lambach, Heinz ; Kulkarni, Satishkumar ; Keller, Thomas F. ; Wittstock, Arne ; Wittwer, Felix and Seyrich, Martin , et al. (2019) In Journal of Synchrotron Radiation 26. p.1769-1781
- Contribution to journal › Article
Mark Synthesis and Characterisation of Hierarchically Structured Titanium Silicalite-1 Zeolites with Large Intracrystalline Macropores
Weissenberger, Tobias ; Leonhardt, Rainer ; Zubiri, Benjamin Apeleo ; Pitínová-Štekrová, Martina ; Sheppard, Thomas L. ; Reiprich, Bastian ; Bauer, Jürgen ; Dotzel, Ralf ; Kahnt, Maik ^LU and Schropp, Andreas , et al. (2019) In Chemistry - A European Journal
- Contribution to journal › Article
2018
Mark Nanofocusing with aberration-corrected rotationally parabolic refractive X-ray lenses
Seiboth, Frank ; Wittwer, Felix ; Scholz, Maria ; Kahnt, Maik ^LU ; Seyrich, Martin ; Schropp, Andreas ; Wagner, Ulrich ; Rau, Christoph ; Garrevoet, Jan and Falkenberg, Gerald , et al. (2018) In Journal of Synchrotron Radiation 25(1). p.108-115
- Contribution to journal › Article
2017
Mark PtyNAMi : Ptychographic nano-analytical microscope at PETRA III - Interferometrically tracking positions for 3D x-ray scanning microscopy using a ball-lens retroreflector
Schroer, Christian G. ; Seyrich, Martin ; Kahnt, Maik ^LU ; Botta, Stephan ; Döhrmann, Ralph ; Falkenberg, Gerald ; Garrevoet, Jan ; Lyubomirskiy, Mikhail ; Scholz, Maria and Schropp, Andreas , et al. (2017) X-Ray Nanoimaging: Instruments and Methods III 2017 10389.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
2016
Mark Quantitative characterization of aberrations in x-ray optics
Seiboth, Frank ; Kahnt, Maik ^LU ; Scholz, Maria ; Seyrich, Martin ; Wittwer, Felix ; Garrevoet, Jan ; Falkenberg, Gerald ; Schropp, Andreas and Schroer, Christian G. (2016) Conferene on Advances in X-Ray/EUV Optics and Components XI 9963.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding