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Multi-slice ptychography enables high-resolution measurements in extended chemical reactors

Kahnt, Maik LU orcid ; Grote, Lukas ; Brückner, Dennis ; Seyrich, Martin ; Wittwer, Felix ; Koziej, Dorota and Schroer, Christian G. (2021) In Scientific Reports 11(1).
Abstract

Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolution, wave propagation within the sample environment has to be taken into account. Here, we demonstrate this effect recording a ptychographic projection of copper(I) oxide nanocubes grown on two sides of a polyimide foil. Reconstructing the nanocubes using the conventional ptychographic model shows the limitation in the achieved resolution due to the thickness of the foil. Whereas, utilizing a multi-slice approach unambiguously separates two... (More)

Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolution, wave propagation within the sample environment has to be taken into account. Here, we demonstrate this effect recording a ptychographic projection of copper(I) oxide nanocubes grown on two sides of a polyimide foil. Reconstructing the nanocubes using the conventional ptychographic model shows the limitation in the achieved resolution due to the thickness of the foil. Whereas, utilizing a multi-slice approach unambiguously separates two sharper reconstructions of nanocubes on both sides of the foil. Moreover, we illustrate how ptychographic multi-slice reconstructions are crucial for high-quality imaging of chemical processes by ex situ studying copper(I) oxide nanocubes grown on the walls of a liquid cell.

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author
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organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Scientific Reports
volume
11
issue
1
article number
1500
publisher
Nature Publishing Group
external identifiers
  • pmid:33452343
  • scopus:85099479408
ISSN
2045-2322
DOI
10.1038/s41598-020-80926-6
language
English
LU publication?
yes
id
7ddbd227-48eb-4b97-a7c4-d21e16437b96
date added to LUP
2021-01-28 09:43:29
date last changed
2024-07-11 07:53:44
@article{7ddbd227-48eb-4b97-a7c4-d21e16437b96,
  abstract     = {{<p>Ptychographic X-ray microscopy is an ideal tool to observe chemical processes under in situ conditions. Chemical reactors, however, are often thicker than the depth of field, limiting the lateral spatial resolution in projection images. To overcome this limit and reach higher lateral spatial resolution, wave propagation within the sample environment has to be taken into account. Here, we demonstrate this effect recording a ptychographic projection of copper(I) oxide nanocubes grown on two sides of a polyimide foil. Reconstructing the nanocubes using the conventional ptychographic model shows the limitation in the achieved resolution due to the thickness of the foil. Whereas, utilizing a multi-slice approach unambiguously separates two sharper reconstructions of nanocubes on both sides of the foil. Moreover, we illustrate how ptychographic multi-slice reconstructions are crucial for high-quality imaging of chemical processes by ex situ studying copper(I) oxide nanocubes grown on the walls of a liquid cell.</p>}},
  author       = {{Kahnt, Maik and Grote, Lukas and Brückner, Dennis and Seyrich, Martin and Wittwer, Felix and Koziej, Dorota and Schroer, Christian G.}},
  issn         = {{2045-2322}},
  language     = {{eng}},
  number       = {{1}},
  publisher    = {{Nature Publishing Group}},
  series       = {{Scientific Reports}},
  title        = {{Multi-slice ptychography enables high-resolution measurements in extended chemical reactors}},
  url          = {{http://dx.doi.org/10.1038/s41598-020-80926-6}},
  doi          = {{10.1038/s41598-020-80926-6}},
  volume       = {{11}},
  year         = {{2021}},
}