Dmitry Dzhigaev
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- 2020
- Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction (
- In Situ Imaging of Ferroelastic Domain Dynamics in CsPbBr3Perovskite Nanowires by Nanofocused Scanning X-ray Diffraction (
- Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques (
- Soft X-ray diffraction patterns measured by a LiF detector with sub-micrometre resolution and an ultimate dynamic range (
- Femtosecond laser produced periodic plasma in a colloidal crystal probed by XFEL radiation (
- 2018
- Structural Changes in a Single GaN Nanowire under Applied Voltage Bias (