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Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view

Wittwer, Felix ; Lyubomirskiy, Mikhail ; Koch, Frieder ; Kahnt, Maik LU orcid ; Seyrich, Martin ; Garrevoet, Jan ; David, Christian and Schroer, Christian G. (2021) In Applied Physics Letters 118(17).
Abstract
Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in... (More)
Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in parallel with up to six illuminating beams. (Less)
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author
; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Letters
volume
118
issue
17
article number
171102
pages
6 pages
publisher
American Institute of Physics (AIP)
external identifiers
  • scopus:85104931417
ISSN
0003-6951
DOI
10.1063/5.0045571
language
English
LU publication?
yes
id
72103f74-9b46-4187-a507-bc6d6bea4e7e
date added to LUP
2021-05-03 10:07:54
date last changed
2023-11-23 02:04:17
@article{72103f74-9b46-4187-a507-bc6d6bea4e7e,
  abstract     = {{Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in parallel with up to six illuminating beams.}},
  author       = {{Wittwer, Felix and Lyubomirskiy, Mikhail and Koch, Frieder and Kahnt, Maik and Seyrich, Martin and Garrevoet, Jan and David, Christian and Schroer, Christian G.}},
  issn         = {{0003-6951}},
  language     = {{eng}},
  number       = {{17}},
  publisher    = {{American Institute of Physics (AIP)}},
  series       = {{Applied Physics Letters}},
  title        = {{Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view}},
  url          = {{http://dx.doi.org/10.1063/5.0045571}},
  doi          = {{10.1063/5.0045571}},
  volume       = {{118}},
  year         = {{2021}},
}