Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view
(2021) In Applied Physics Letters 118(17).- Abstract
- Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in... (More)
- Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in parallel with up to six illuminating beams. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/72103f74-9b46-4187-a507-bc6d6bea4e7e
- author
- Wittwer, Felix ; Lyubomirskiy, Mikhail ; Koch, Frieder ; Kahnt, Maik LU ; Seyrich, Martin ; Garrevoet, Jan ; David, Christian and Schroer, Christian G.
- organization
- publishing date
- 2021
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Applied Physics Letters
- volume
- 118
- issue
- 17
- article number
- 171102
- pages
- 6 pages
- publisher
- American Institute of Physics (AIP)
- external identifiers
-
- scopus:85104931417
- ISSN
- 0003-6951
- DOI
- 10.1063/5.0045571
- language
- English
- LU publication?
- yes
- id
- 72103f74-9b46-4187-a507-bc6d6bea4e7e
- date added to LUP
- 2021-05-03 10:07:54
- date last changed
- 2023-11-23 02:04:17
@article{72103f74-9b46-4187-a507-bc6d6bea4e7e, abstract = {{Nondestructive imaging with both a large field of view and a high spatial resolution is crucial to understand complex materials and processes in science and technology. X-ray ptychography can provide highest spatial resolution but is limited in the field of view by the acquisition time and coherent flux at modern x-ray sources. By multi-beam ptychography, the sample can be imaged in parallel by several spatially separated and mutually incoherent beams. We have implemented this method using 3D nanoprinted x-ray optics to create tailor-made x-ray multi-beam arrays. The use of 3D printing allows us to create focusing optics with a minimum of nonfunctional support structures. In this way, large sample areas can be efficiently scanned in parallel with up to six illuminating beams.}}, author = {{Wittwer, Felix and Lyubomirskiy, Mikhail and Koch, Frieder and Kahnt, Maik and Seyrich, Martin and Garrevoet, Jan and David, Christian and Schroer, Christian G.}}, issn = {{0003-6951}}, language = {{eng}}, number = {{17}}, publisher = {{American Institute of Physics (AIP)}}, series = {{Applied Physics Letters}}, title = {{Upscaling of multi-beam x-ray ptychography for efficient x-ray microscopy with high resolution and large field of view}}, url = {{http://dx.doi.org/10.1063/5.0045571}}, doi = {{10.1063/5.0045571}}, volume = {{118}}, year = {{2021}}, }