Runqing Yang

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2024
Mark X-Ray Multibeam Ptychography at up to 20 keV : Nano-Lithography Enhances X-Ray Nano-Imaging
Li, Tang ; Kahnt, Maik ^LU ; Sheppard, Thomas L. ; Yang, Runqing ^LU ; Falch, Ken V. ; Zvagelsky, Roman ; Villanueva-Perez, Pablo ^LU ; Wegener, Martin and Lyubomirskiy, Mikhail (2024) In Advanced Science 11(30).
- Contribution to journal › Article
Mark ForMAX – a beamline for multiscale and multimodal structural characterization of hierarchical materials
Nygård, K. ^LU ; McDonald, S. A. ^LU ; González, J. B. ^LU ; Haghighat, V. ^LU ; Appel, Christian ; Larsson, E. ^LU ; Ghanbari, R. ^LU ; Viljanen, M. ^LU ; Silva, José and Malki, S. ^LU , et al. (2024) In Journal of Synchrotron Radiation 31(Pt 2). p.363-377
- Contribution to journal › Article