Lund University Publications

1 – 5 of 5

show: 10
|
sort: year (new to old)

Embed this list

copy and paste the html snippet below into your own page:

<iframe src="https://lup.lub.lu.se/search/publication?embed=1&q=author%3D%22Vogt%2C+Ulrich%22+or+(documentType+any+%22bookEditor+conferenceEditor%22+and+editor%3D%22Vogt%2C+Ulrich%22)&amp;hide_pagination=1&amp;hide_info=1&amp;hide_options=1"
  width="100%"
  height="400"
  allowtransparency="true"
  frameborder="0">
</iframe>

2020
- Contribution to journal Article
Ptychographic characterization of a coherent nanofocused X-ray beam
Björling, Alexander ^LU ; Kalbfleisch, Sebastian ^LU ; Kahnt, Maik ^LU ; Sala, Simone ^LU ; Parfeniukas, Karolis ; Vogt, Ulrich ; Carbone, Gerardina ^LU and Johansson, Ulf ^LU (2020) In Optics Express 28(4). p.5069-5076 Mark
2017
- Contribution to journal Article
Interferometric characterization of rotation stages for X-ray nanotomography
Stankevic, Tomas ^LU ; Engblom, Christer ; Langlois, Florent ; Alves, Filipe ; Lestrade, Alain ; Jobert, Nicolas ; Cauchon, Gilles ; Vogt, Ulrich and Kubsky, Stefan (2017) In Review of Scientific Instruments 88(5). Mark
- Chapter in Book/Report/Conference proceeding Paper in conference proceeding
First x-ray nanoimaging experiments at NanoMAX
Vogt, Ulrich ; Parfeniukas, Karolis ; Stankevič, Tomaš ^LU ; Kalbfleisch, Sebastian ^LU ; Liebi, Marianne ^LU ; Matej, Zdenek ^LU ; Björling, Alexander ^LU ; Carbone, Gerardina ^LU ; Mikkelsen, Anders ^LU and Johansson, Ulf ^LU (2017) X-Ray Nanoimaging: Instruments and Methods III 2017 10389. Mark
- Contribution to journal Article
Moiré method for nanometer instability investigation of scanning hard x-ray microscopes
Vogt, Ulrich ; Köhler, Daniel ; Dickmann, Jannis ; Rahomäki, Jussi ; Parfeniukas, Karolis ; Kubsky, Stefan ; Alves, Filipe ; Langlois, Florent ; Engblom, Christer and Stankevic, Tomas ^LU (2017) In Optics Express 25(11). p.12188-12194 Mark
2013
- Chapter in Book/Report/Conference proceeding Paper in conference proceeding
NanoMAX: A hard x-ray nanoprobe beamline at MAX IV
Johansson, Ulf ^LU ; Vogt, Ulrich and Mikkelsen, Anders (2013) SPIE X-ray Nanoimaging Conference - Instruments and Methods 8851. p.88510-88510 Mark

your query:: Remove author: Vogt, Ulrich

Lund University Publications

LUND UNIVERSITY LIBRARIES