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2023
Mark Multi-beam ptychography with coded in-line Fresnel zone plates
Astrand, Mattias ; Kahnt, Maik ^LU ; Johansson, Ulf ^LU and Vogt, Ulrich (2023) X-Ray Nanoimaging: Instruments and Methods VI 2023 In Proceedings of SPIE - The International Society for Optical Engineering 12698.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Current capabilities of the imaging endstation at the NanoMAX beamline
Kahnt, Maik ^LU ; Selberg, Johan ^LU ; Vogt, Ulrich ; Åstrand, Mattias ; Björling, Alexander ^LU ; Kalbfleisch, Sebastian ^LU ; Andreasen, Jens W. ; Thånell, Karina ^LU and Johansson, Ulf ^LU (2023) 15th International Conference on X-ray Microscopy, XRM 2022
- Contribution to conference › Paper, not in proceeding
2021
Mark NanoMAX : The hard X-ray nanoprobe beamline at the MAX IV Laboratory
Johansson, Ulf ^LU ; Carbone, Dina ^LU ; Kalbfleisch, Sebastian ^LU ; Björling, Alexander ^LU ; Kahnt, Maik ^LU ; Sala, Simone ^LU ; Stankevic, Tomas ^LU ; Liebi, Marianne ^LU ; Fernandez, Angel Rodriguez ^LU and Bring, Björn ^LU , et al. (2021) In Journal of Synchrotron Radiation 28. p.1935-1947
- Contribution to journal › Article
2020
Mark Ptychographic characterization of a coherent nanofocused X-ray beam
Björling, Alexander ^LU ; Kalbfleisch, Sebastian ^LU ; Kahnt, Maik ^LU ; Sala, Simone ^LU ; Parfeniukas, Karolis ; Vogt, Ulrich ; Carbone, Gerardina ^LU and Johansson, Ulf ^LU (2020) In Optics Express 28(4). p.5069-5076
- Contribution to journal › Article
Mark Metal-assisted chemical etching and electroless deposition for fabrication of hard X-ray Pd/Si zone plates
Akan, Rabia ; Frisk, Thomas ; Lundberg, Fabian ; Ohlin, Hanna ; Johansson, Ulf ^LU ; Li, Kenan ; Sakdinawat, Anne and Vogt, Ulrich (2020) In Micromachines 11(3).
- Contribution to journal › Article
2017
Mark Interferometric characterization of rotation stages for X-ray nanotomography
Stankevic, Tomas ^LU ; Engblom, Christer ; Langlois, Florent ; Alves, Filipe ; Lestrade, Alain ; Jobert, Nicolas ; Cauchon, Gilles ; Vogt, Ulrich and Kubsky, Stefan (2017) In Review of Scientific Instruments 88(5).
- Contribution to journal › Article
Mark First x-ray nanoimaging experiments at NanoMAX
Vogt, Ulrich ; Parfeniukas, Karolis ; Stankevič, Tomaš ^LU ; Kalbfleisch, Sebastian ^LU ; Liebi, Marianne ^LU ; Matej, Zdenek ^LU ; Björling, Alexander ^LU ; Carbone, Gerardina ^LU ; Mikkelsen, Anders ^LU and Johansson, Ulf ^LU (2017) X-Ray Nanoimaging: Instruments and Methods III 2017 10389.
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
Mark Moiré method for nanometer instability investigation of scanning hard x-ray microscopes
Vogt, Ulrich ; Köhler, Daniel ; Dickmann, Jannis ; Rahomäki, Jussi ; Parfeniukas, Karolis ; Kubsky, Stefan ; Alves, Filipe ; Langlois, Florent ; Engblom, Christer and Stankevic, Tomas ^LU (2017) In Optics Express 25(11). p.12188-12194
- Contribution to journal › Article
2013
Mark NanoMAX: A hard x-ray nanoprobe beamline at MAX IV
Johansson, Ulf ^LU ; Vogt, Ulrich and Mikkelsen, Anders (2013) SPIE X-ray Nanoimaging Conference - Instruments and Methods 8851. p.88510-88510
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding

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