Moiré method for nanometer instability investigation of scanning hard x-ray microscopes
(2017) In Optics Express 25(11). p.12188-12194- Abstract
We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The... (More)
We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.
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- author
- Vogt, Ulrich ; Köhler, Daniel ; Dickmann, Jannis ; Rahomäki, Jussi ; Parfeniukas, Karolis ; Kubsky, Stefan ; Alves, Filipe ; Langlois, Florent ; Engblom, Christer and Stankevic, Tomas LU
- organization
- publishing date
- 2017-05-29
- type
- Contribution to journal
- publication status
- published
- subject
- in
- Optics Express
- volume
- 25
- issue
- 11
- pages
- 7 pages
- publisher
- Optical Society of America
- external identifiers
-
- scopus:85019983867
- wos:000403940700013
- pmid:28786577
- ISSN
- 1094-4087
- DOI
- 10.1364/OE.25.012188
- language
- English
- LU publication?
- yes
- id
- 85245a33-750e-49c9-9e52-a4387d2e6e70
- date added to LUP
- 2017-06-28 09:32:14
- date last changed
- 2024-02-29 17:31:55
@article{85245a33-750e-49c9-9e52-a4387d2e6e70,
abstract = {{<p>We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.</p>}},
author = {{Vogt, Ulrich and Köhler, Daniel and Dickmann, Jannis and Rahomäki, Jussi and Parfeniukas, Karolis and Kubsky, Stefan and Alves, Filipe and Langlois, Florent and Engblom, Christer and Stankevic, Tomas}},
issn = {{1094-4087}},
language = {{eng}},
month = {{05}},
number = {{11}},
pages = {{12188--12194}},
publisher = {{Optical Society of America}},
series = {{Optics Express}},
title = {{Moiré method for nanometer instability investigation of scanning hard x-ray microscopes}},
url = {{http://dx.doi.org/10.1364/OE.25.012188}},
doi = {{10.1364/OE.25.012188}},
volume = {{25}},
year = {{2017}},
}