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Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

Vogt, Ulrich; Köhler, Daniel; Dickmann, Jannis; Rahomäki, Jussi; Parfeniukas, Karolis; Kubsky, Stefan; Alves, Filipe; Langlois, Florent; Engblom, Christer and Stankevic, Tomas LU (2017) In Optics Express 25(11). p.12188-12194
Abstract

We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The... (More)

We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.

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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Optics Express
volume
25
issue
11
pages
7 pages
publisher
OSA
external identifiers
  • scopus:85019983867
  • wos:000403940700013
ISSN
1094-4087
DOI
10.1364/OE.25.012188
language
English
LU publication?
yes
id
85245a33-750e-49c9-9e52-a4387d2e6e70
date added to LUP
2017-06-28 09:32:14
date last changed
2017-09-18 11:43:21
@article{85245a33-750e-49c9-9e52-a4387d2e6e70,
  abstract     = {<p>We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.</p>},
  author       = {Vogt, Ulrich and Köhler, Daniel and Dickmann, Jannis and Rahomäki, Jussi and Parfeniukas, Karolis and Kubsky, Stefan and Alves, Filipe and Langlois, Florent and Engblom, Christer and Stankevic, Tomas},
  issn         = {1094-4087},
  language     = {eng},
  month        = {05},
  number       = {11},
  pages        = {12188--12194},
  publisher    = {OSA},
  series       = {Optics Express},
  title        = {Moiré method for nanometer instability investigation of scanning hard x-ray microscopes},
  url          = {http://dx.doi.org/10.1364/OE.25.012188},
  volume       = {25},
  year         = {2017},
}