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Multi-beam ptychography with coded in-line Fresnel zone plates

Astrand, Mattias ; Kahnt, Maik LU orcid ; Johansson, Ulf LU and Vogt, Ulrich (2023) X-Ray Nanoimaging: Instruments and Methods VI 2023 In Proceedings of SPIE - The International Society for Optical Engineering 12698.
Abstract

X-ray ptychography is often implemented for nanoimaging at synchrotron radiation sources and extensions are being developed to make experiments faster. This work is on multi-beam ptychography with Fresnel zone plates that have a small lateral separation, enabling the imaging of an extended field of view without increasing exposure time. Sectional zone inversion is implemented for coding respective probes and up to three Fresnel zone plates are successfully used in parallel. The speed-up achieved, compared to single beam ptychography, is linear with the number of probes. The combination of versatility of the fabrication process for the Fresnel zone plates and performance enhancement by scanning in multi-beam mode makes this an optimal... (More)

X-ray ptychography is often implemented for nanoimaging at synchrotron radiation sources and extensions are being developed to make experiments faster. This work is on multi-beam ptychography with Fresnel zone plates that have a small lateral separation, enabling the imaging of an extended field of view without increasing exposure time. Sectional zone inversion is implemented for coding respective probes and up to three Fresnel zone plates are successfully used in parallel. The speed-up achieved, compared to single beam ptychography, is linear with the number of probes. The combination of versatility of the fabrication process for the Fresnel zone plates and performance enhancement by scanning in multi-beam mode makes this an optimal solution for studying samples fast and obtaining enlarged fields of view.

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author
; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
Fresnel zone plate, multi-beam, ptychography
host publication
X-Ray Nanoimaging : Instruments and Methods VI - Instruments and Methods VI
series title
Proceedings of SPIE - The International Society for Optical Engineering
editor
Lai, Barry and Somogyi, Andrea
volume
12698
article number
1269807-1
publisher
SPIE
conference name
X-Ray Nanoimaging: Instruments and Methods VI 2023
conference location
San Diego, United States
conference dates
2023-08-23 - 2023-08-24
external identifiers
  • scopus:85176504471
ISSN
1996-756X
0277-786X
ISBN
9781510666108
DOI
10.1117/12.2676657
language
English
LU publication?
yes
additional info
Publisher Copyright: © 2023 SPIE. All rights reserved.
id
d9b2f680-5cbf-42fc-897c-16818f5fbc41
date added to LUP
2023-11-21 13:08:27
date last changed
2024-04-18 16:21:37
@inproceedings{d9b2f680-5cbf-42fc-897c-16818f5fbc41,
  abstract     = {{<p>X-ray ptychography is often implemented for nanoimaging at synchrotron radiation sources and extensions are being developed to make experiments faster. This work is on multi-beam ptychography with Fresnel zone plates that have a small lateral separation, enabling the imaging of an extended field of view without increasing exposure time. Sectional zone inversion is implemented for coding respective probes and up to three Fresnel zone plates are successfully used in parallel. The speed-up achieved, compared to single beam ptychography, is linear with the number of probes. The combination of versatility of the fabrication process for the Fresnel zone plates and performance enhancement by scanning in multi-beam mode makes this an optimal solution for studying samples fast and obtaining enlarged fields of view.</p>}},
  author       = {{Astrand, Mattias and Kahnt, Maik and Johansson, Ulf and Vogt, Ulrich}},
  booktitle    = {{X-Ray Nanoimaging : Instruments and Methods VI}},
  editor       = {{Lai, Barry and Somogyi, Andrea}},
  isbn         = {{9781510666108}},
  issn         = {{1996-756X}},
  keywords     = {{Fresnel zone plate; multi-beam; ptychography}},
  language     = {{eng}},
  publisher    = {{SPIE}},
  series       = {{Proceedings of SPIE - The International Society for Optical Engineering}},
  title        = {{Multi-beam ptychography with coded in-line Fresnel zone plates}},
  url          = {{http://dx.doi.org/10.1117/12.2676657}},
  doi          = {{10.1117/12.2676657}},
  volume       = {{12698}},
  year         = {{2023}},
}