MAXPEEM : a spectromicroscopy beamline at MAX IV laboratory
(2023) In Journal of Synchrotron Radiation 30(Pt 2). p.468-478- Abstract
MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s−1 (0.1% bandwidth)−1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the... (More)
MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s−1 (0.1% bandwidth)−1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.
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- author
- Niu, Yuran LU ; Vinogradov, Nikolay LU ; Preobrajenski, Alexei LU ; Struzzi, Claudia LU ; Sarpi, Brice LU ; Zhu, Lin LU ; Golias, Evangelos LU and Zakharov, Alexei LU
- organization
- publishing date
- 2023-02-03
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- ACLEEM, micro-ARPES, X-ray photoelectron microscopy, XMCD
- in
- Journal of Synchrotron Radiation
- volume
- 30
- issue
- Pt 2
- pages
- 11 pages
- publisher
- International Union of Crystallography
- external identifiers
-
- pmid:36891861
- scopus:85149616771
- ISSN
- 0909-0495
- DOI
- 10.1107/S160057752300019X
- language
- English
- LU publication?
- yes
- id
- 2e8f80e9-c714-4dfc-9e9b-a832543b0ef3
- date added to LUP
- 2023-06-09 14:29:28
- date last changed
- 2024-04-19 22:43:25
@article{2e8f80e9-c714-4dfc-9e9b-a832543b0ef3, abstract = {{<p>MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥10<sup>15</sup> photons s<sup>−1</sup> (0.1% bandwidth)<sup>−1</sup> in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.</p>}}, author = {{Niu, Yuran and Vinogradov, Nikolay and Preobrajenski, Alexei and Struzzi, Claudia and Sarpi, Brice and Zhu, Lin and Golias, Evangelos and Zakharov, Alexei}}, issn = {{0909-0495}}, keywords = {{ACLEEM; micro-ARPES; X-ray photoelectron microscopy; XMCD}}, language = {{eng}}, month = {{02}}, number = {{Pt 2}}, pages = {{468--478}}, publisher = {{International Union of Crystallography}}, series = {{Journal of Synchrotron Radiation}}, title = {{MAXPEEM : a spectromicroscopy beamline at MAX IV laboratory}}, url = {{http://dx.doi.org/10.1107/S160057752300019X}}, doi = {{10.1107/S160057752300019X}}, volume = {{30}}, year = {{2023}}, }