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MAXPEEM : a spectromicroscopy beamline at MAX IV laboratory

Niu, Yuran LU ; Vinogradov, Nikolay LU orcid ; Preobrajenski, Alexei LU ; Struzzi, Claudia LU orcid ; Sarpi, Brice LU ; Zhu, Lin LU ; Golias, Evangelos LU orcid and Zakharov, Alexei LU (2023) In Journal of Synchrotron Radiation 30(Pt 2). p.468-478
Abstract

MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s−1 (0.1% bandwidth)−1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the... (More)

MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥1015 photons s−1 (0.1% bandwidth)−1 in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.

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author
; ; ; ; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
ACLEEM, micro-ARPES, X-ray photoelectron microscopy, XMCD
in
Journal of Synchrotron Radiation
volume
30
issue
Pt 2
pages
11 pages
publisher
International Union of Crystallography
external identifiers
  • pmid:36891861
  • scopus:85149616771
ISSN
0909-0495
DOI
10.1107/S160057752300019X
language
English
LU publication?
yes
id
2e8f80e9-c714-4dfc-9e9b-a832543b0ef3
date added to LUP
2023-06-09 14:29:28
date last changed
2024-04-19 22:43:25
@article{2e8f80e9-c714-4dfc-9e9b-a832543b0ef3,
  abstract     = {{<p>MAXPEEM, a dedicated photoemission electron microscopy beamline at MAX IV Laboratory, houses a state-of-the-art aberration-corrected spectroscopic photoemission and low-energy electron microscope (AC-SPELEEM). This powerful instrument offers a wide range of complementary techniques providing structural, chemical and magnetic sensitivities with a single-digit nanometre spatial resolution. The beamline can deliver a high photon flux of ≥10<sup>15</sup> photons s<sup>−1</sup> (0.1% bandwidth)<sup>−1</sup> in the range 30–1200 eV with full control of the polarization from an elliptically polarized undulator. The microscope has several features which make it unique from similar instruments. The X-rays from the synchrotron pass through the first beam separator and impinge the surface at normal incidence. The microscope is equipped with an energy analyzer and an aberration corrector which improves both the resolution and the transmission compared with standard microscopes. A new fiber-coupled CMOS camera features an improved modulation transfer function, dynamic range and signal-to-noise ratio compared with the traditional MCP-CCD detection system.</p>}},
  author       = {{Niu, Yuran and Vinogradov, Nikolay and Preobrajenski, Alexei and Struzzi, Claudia and Sarpi, Brice and Zhu, Lin and Golias, Evangelos and Zakharov, Alexei}},
  issn         = {{0909-0495}},
  keywords     = {{ACLEEM; micro-ARPES; X-ray photoelectron microscopy; XMCD}},
  language     = {{eng}},
  month        = {{02}},
  number       = {{Pt 2}},
  pages        = {{468--478}},
  publisher    = {{International Union of Crystallography}},
  series       = {{Journal of Synchrotron Radiation}},
  title        = {{MAXPEEM : a spectromicroscopy beamline at MAX IV laboratory}},
  url          = {{http://dx.doi.org/10.1107/S160057752300019X}},
  doi          = {{10.1107/S160057752300019X}},
  volume       = {{30}},
  year         = {{2023}},
}