Performance of an alpha-IPEM
(2006) Seventeenth International Conference on Ion Beam Analysis 249. p.242-245- Abstract
- The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be... (More)
- The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be the only way to maintain the high utility of radiation effects microscopy into the future. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/398262
- author
- Rossi, P ; Doyle, B. L. ; Auzelyte, Vaida LU ; McDaniel, F. D. and Mellon, M
- organization
- publishing date
- 2006
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- proton beam lithography, ion-luminescence, ion photon emission microscopy, phosphors, micro-fabrication, ion beam analysis
- host publication
- Ion Beam Analysis - Proceedings of the Seventeenth International Conference on Ion Beam Analysis (Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms)
- volume
- 249
- pages
- 242 - 245
- publisher
- Elsevier
- conference name
- Seventeenth International Conference on Ion Beam Analysis
- conference location
- Sevilla, Spain
- conference dates
- 2005-06-26 - 2005-07-01
- external identifiers
-
- wos:000239545000061
- scopus:33745860420
- ISSN
- 0168-583X
- DOI
- 10.1016/j.nimb.2006.04.050
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007)
- id
- 354a88a7-27d4-4d6a-8f12-172b0b5dd513 (old id 398262)
- date added to LUP
- 2016-04-01 16:58:14
- date last changed
- 2022-01-28 23:23:01
@inproceedings{354a88a7-27d4-4d6a-8f12-172b0b5dd513,
abstract = {{The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be the only way to maintain the high utility of radiation effects microscopy into the future.}},
author = {{Rossi, P and Doyle, B. L. and Auzelyte, Vaida and McDaniel, F. D. and Mellon, M}},
booktitle = {{Ion Beam Analysis - Proceedings of the Seventeenth International Conference on Ion Beam Analysis (Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms)}},
issn = {{0168-583X}},
keywords = {{proton beam lithography; ion-luminescence; ion photon emission microscopy; phosphors; micro-fabrication; ion beam analysis}},
language = {{eng}},
pages = {{242--245}},
publisher = {{Elsevier}},
title = {{Performance of an alpha-IPEM}},
url = {{http://dx.doi.org/10.1016/j.nimb.2006.04.050}},
doi = {{10.1016/j.nimb.2006.04.050}},
volume = {{249}},
year = {{2006}},
}