Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations
(2013) International Symposium on Electromagnetic Theory (EMTS URSI ) 2013 p.942-945- Abstract
- We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/3616478
- author
- Sjöberg, Daniel LU and Larsson, Christer LU
- organization
- publishing date
- 2013
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- [Host publication title missing]
- pages
- 4 pages
- publisher
- IEEE - Institute of Electrical and Electronics Engineers Inc.
- conference name
- International Symposium on Electromagnetic Theory (EMTS URSI ) 2013
- conference location
- Hiroshima, Japan
- conference dates
- 2013-05-20 - 2013-05-23
- external identifiers
-
- wos:000327180500242
- scopus:84883255814
- ISSN
- 2163-405X
- language
- English
- LU publication?
- yes
- id
- b9c53f95-b0e9-4a4b-a0bf-3494d0c8038b (old id 3616478)
- alternative location
- http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6565899
- date added to LUP
- 2016-04-01 14:02:50
- date last changed
- 2022-01-27 22:33:33
@inproceedings{b9c53f95-b0e9-4a4b-a0bf-3494d0c8038b, abstract = {{We present a method aimed at reducing uncertainties and instabilities when characterizing materials in waveguide setups. The S-parameters for a rectangular waveguide loaded with a rectangular sample block are measured for three different sample orientations, and the corresponding geometries are modeled in a finite element program, taking any material parameters as input. The material parameters of the sample are found by minimizing the squared distance between measured and calculated S-parameters.}}, author = {{Sjöberg, Daniel and Larsson, Christer}}, booktitle = {{[Host publication title missing]}}, issn = {{2163-405X}}, language = {{eng}}, pages = {{942--945}}, publisher = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}}, title = {{Material Characterization in Partially Filled Waveguides Using Inverse Scattering and Multiple Sample Orientations}}, url = {{http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6565899}}, year = {{2013}}, }