Current-voltage correlations in interferometers
(2007) In New Journal of Physics 9.- Abstract
- We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in... (More)
- We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here. (Less)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/662962
- author
- Foerster, Heidi ; Samuelsson, Peter LU and Buettiker, Markus
- organization
- publishing date
- 2007
- type
- Contribution to journal
- publication status
- published
- subject
- in
- New Journal of Physics
- volume
- 9
- publisher
- IOP Publishing
- external identifiers
-
- wos:000246650800007
- scopus:34248333858
- ISSN
- 1367-2630
- DOI
- 10.1088/1367-2630/9/5/117
- language
- English
- LU publication?
- yes
- id
- 36d92e8f-cea1-4b48-8a5f-8e091f1aad90 (old id 662962)
- date added to LUP
- 2016-04-01 16:47:17
- date last changed
- 2022-02-27 23:38:52
@article{36d92e8f-cea1-4b48-8a5f-8e091f1aad90,
abstract = {{We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here.}},
author = {{Foerster, Heidi and Samuelsson, Peter and Buettiker, Markus}},
issn = {{1367-2630}},
language = {{eng}},
publisher = {{IOP Publishing}},
series = {{New Journal of Physics}},
title = {{Current-voltage correlations in interferometers}},
url = {{http://dx.doi.org/10.1088/1367-2630/9/5/117}},
doi = {{10.1088/1367-2630/9/5/117}},
volume = {{9}},
year = {{2007}},
}