A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging
(2020) In Journal of Synchrotron Radiation 27. p.134-145- Abstract
Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It... (More)
Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.
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- author
- Fevola, Giovanni ; Knudsen, Erik Bergback ; Ramos, Tiago ; Carbone, Dina LU and Andreasen, Jens Wenzel
- organization
- publishing date
- 2020
- type
- Contribution to journal
- publication status
- published
- subject
- keywords
- coherent diffractive imaging, Monte Carlo simulations, ptychography H2020 European Research Council 681881 Ministeriet for Forskning Innovation og Videregående Uddannelser 7005-000005B, ray tracing, X-ray microscopy
- in
- Journal of Synchrotron Radiation
- volume
- 27
- pages
- 12 pages
- publisher
- International Union of Crystallography
- external identifiers
-
- scopus:85077146270
- pmid:31868746
- ISSN
- 0909-0495
- DOI
- 10.1107/S1600577519014425
- language
- English
- LU publication?
- yes
- id
- 37f01ad3-d958-4191-a23b-b45fc502286c
- date added to LUP
- 2020-01-10 11:53:37
- date last changed
- 2024-04-17 02:13:50
@article{37f01ad3-d958-4191-a23b-b45fc502286c,
abstract = {{<p>Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.</p>}},
author = {{Fevola, Giovanni and Knudsen, Erik Bergback and Ramos, Tiago and Carbone, Dina and Andreasen, Jens Wenzel}},
issn = {{0909-0495}},
keywords = {{coherent diffractive imaging; Monte Carlo simulations; ptychography H2020 European Research Council 681881 Ministeriet for Forskning Innovation og Videregående Uddannelser 7005-000005B; ray tracing; X-ray microscopy}},
language = {{eng}},
pages = {{134--145}},
publisher = {{International Union of Crystallography}},
series = {{Journal of Synchrotron Radiation}},
title = {{A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging}},
url = {{http://dx.doi.org/10.1107/S1600577519014425}},
doi = {{10.1107/S1600577519014425}},
volume = {{27}},
year = {{2020}},
}