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Performance of an alpha-IPEM

Rossi, P ; Doyle, B. L. ; Auzelyte, Vaida LU ; McDaniel, F. D. and Mellon, M (2006) Seventeenth International Conference on Ion Beam Analysis 249. p.242-245
Abstract
The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be... (More)
The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be the only way to maintain the high utility of radiation effects microscopy into the future. (Less)
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author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
proton beam lithography, ion-luminescence, ion photon emission microscopy, phosphors, micro-fabrication, ion beam analysis
host publication
Ion Beam Analysis - Proceedings of the Seventeenth International Conference on Ion Beam Analysis (Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms)
volume
249
pages
242 - 245
publisher
Elsevier
conference name
Seventeenth International Conference on Ion Beam Analysis
conference location
Sevilla, Spain
conference dates
2005-06-26 - 2005-07-01
external identifiers
  • wos:000239545000061
  • scopus:33745860420
ISSN
0168-583X
DOI
10.1016/j.nimb.2006.04.050
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Nuclear Physics (Faculty of Technology) (011013007)
id
354a88a7-27d4-4d6a-8f12-172b0b5dd513 (old id 398262)
date added to LUP
2016-04-01 16:58:14
date last changed
2021-02-17 07:27:54
@inproceedings{354a88a7-27d4-4d6a-8f12-172b0b5dd513,
  abstract     = {The ion photon emission microscope, or IPEM, is the first device that allows scientists to microscopically study the effects of single ions in air on semiconductors, microchips and even biological cells without having to focus the beam. Reported here is a prototype, the size of a conventional optical microscope, developed at Sandia. The alpha-IPEM, that employs alpha particles from a radioactive source, represents the first example of IBA imaging without an accelerator. The IPEM resolution is currently limited to similar to 10 mu m, but we also report a gridded-phosphor approach that could improve this resolution to that of the optical microscope, or similar to 1 mu m. Finally, we propose that a simple adaptation of the alpha-IPEM could be the only way to maintain the high utility of radiation effects microscopy into the future.},
  author       = {Rossi, P and Doyle, B. L. and Auzelyte, Vaida and McDaniel, F. D. and Mellon, M},
  booktitle    = {Ion Beam Analysis - Proceedings of the Seventeenth International Conference on Ion Beam Analysis (Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms)},
  issn         = {0168-583X},
  language     = {eng},
  pages        = {242--245},
  publisher    = {Elsevier},
  title        = {Performance of an alpha-IPEM},
  url          = {http://dx.doi.org/10.1016/j.nimb.2006.04.050},
  doi          = {10.1016/j.nimb.2006.04.050},
  volume       = {249},
  year         = {2006},
}