A Deep Learning Approach for Root Cause Analysis of Application Anomalies for Real-Time IIoT
(2023)
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/40863d79-e20b-4539-81ec-43f95412f496
- author
- Saleem, Ahsan ; Raeiszadeh, Mahsa ; Ebrahimzadeh, Amin ; Glitho, Roch ; Eker, Johan LU and Mini, Raquel LU
- organization
- publishing date
- 2023-05-08
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- host publication
- Proceedings of 36th IEEE/IFIP Network Operations and Management Symposium (NOMS 2023)
- language
- English
- LU publication?
- yes
- id
- 40863d79-e20b-4539-81ec-43f95412f496
- date added to LUP
- 2023-01-16 11:31:43
- date last changed
- 2023-01-23 14:05:30
@inproceedings{40863d79-e20b-4539-81ec-43f95412f496, author = {{Saleem, Ahsan and Raeiszadeh, Mahsa and Ebrahimzadeh, Amin and Glitho, Roch and Eker, Johan and Mini, Raquel}}, booktitle = {{Proceedings of 36th IEEE/IFIP Network Operations and Management Symposium (NOMS 2023)}}, language = {{eng}}, month = {{05}}, title = {{A Deep Learning Approach for Root Cause Analysis of Application Anomalies for Real-Time IIoT}}, year = {{2023}}, }