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A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs

Shi, Zhan; Zhao, Ruifeng; Li, Wenxian; Tu, Bingsheng; Yang, Yang; Xiao, Jun; Huldt, Sven LU ; Hutton, Roger and Zou, Yaming (2014) In Review of Scientific Instruments 85(6).
Abstract
A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient... (More)
A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 angstrom. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasma width, the estimated resolving power will be around 1400 at 221.15 angstrom. (C) 2014 AIP Publishing LLC. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Review of Scientific Instruments
volume
85
issue
6
publisher
American Institute of Physics
external identifiers
  • wos:000339010500011
  • scopus:84902670019
ISSN
1089-7623
DOI
10.1063/1.4876597
language
English
LU publication?
yes
id
3da2f2ed-b643-4e73-b0dd-0f6c314a91ff (old id 4598781)
date added to LUP
2014-09-04 09:50:37
date last changed
2017-05-21 04:05:41
@article{3da2f2ed-b643-4e73-b0dd-0f6c314a91ff,
  abstract     = {A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 angstrom. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasma width, the estimated resolving power will be around 1400 at 221.15 angstrom. (C) 2014 AIP Publishing LLC.},
  articleno    = {063110},
  author       = {Shi, Zhan and Zhao, Ruifeng and Li, Wenxian and Tu, Bingsheng and Yang, Yang and Xiao, Jun and Huldt, Sven and Hutton, Roger and Zou, Yaming},
  issn         = {1089-7623},
  language     = {eng},
  number       = {6},
  publisher    = {American Institute of Physics},
  series       = {Review of Scientific Instruments},
  title        = {A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs},
  url          = {http://dx.doi.org/10.1063/1.4876597},
  volume       = {85},
  year         = {2014},
}