Advanced

In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

Bertram, Florian LU ; Zhang, F.; Evertsson, Jonas LU ; Carla, F.; Pan, J.; Messing, Maria LU ; Mikkelsen, Anders LU ; Nilsson, J-O and Lundgren, Edvin LU (2014) In Applied Physics Reviews 116(3).
Abstract
We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy. (C) 2014 Author(s).
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Reviews
volume
116
issue
3
publisher
American Institute of Physics
external identifiers
  • wos:000340710500089
  • scopus:84904646508
ISSN
0021-8979
DOI
10.1063/1.4890318
language
English
LU publication?
yes
id
8cba2154-be2d-4990-89a8-e5fe0622c786 (old id 4659329)
date added to LUP
2014-09-24 15:11:03
date last changed
2017-09-24 03:07:36
@article{8cba2154-be2d-4990-89a8-e5fe0622c786,
  abstract     = {We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy. (C) 2014 Author(s).},
  articleno    = {034902},
  author       = {Bertram, Florian and Zhang, F. and Evertsson, Jonas and Carla, F. and Pan, J. and Messing, Maria and Mikkelsen, Anders and Nilsson, J-O and Lundgren, Edvin},
  issn         = {0021-8979},
  language     = {eng},
  number       = {3},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Reviews},
  title        = {In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy},
  url          = {http://dx.doi.org/10.1063/1.4890318},
  volume       = {116},
  year         = {2014},
}