Advanced

Robustness of TAP-based Scan Networks

Ghani Zadegan, Farrokh LU ; Carlsson, Gunnar and Larsson, Erik LU (2014) IEEE International Test Conference, 2014 In [Host publication title missing]
Abstract
It is common to embed instruments when developing integrated circuits (ICs). These instruments are accessed at post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and operator-driven in-field test. At any of these scenarios, it is of interest to access some but not all of the instruments. IEEE 1149.1-2013 and IEEE 1687 propose Test Access Port based (TAP-based) mechanisms to design flexible scan networks such that any combination of instruments can be accessed from outside of the IC. Previous works optimize TAP-based scan networks for one scenario with a known number of accesses. However, at design time, it is difficult... (More)
It is common to embed instruments when developing integrated circuits (ICs). These instruments are accessed at post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and operator-driven in-field test. At any of these scenarios, it is of interest to access some but not all of the instruments. IEEE 1149.1-2013 and IEEE 1687 propose Test Access Port based (TAP-based) mechanisms to design flexible scan networks such that any combination of instruments can be accessed from outside of the IC. Previous works optimize TAP-based scan networks for one scenario with a known number of accesses. However, at design time, it is difficult to foresee all needed scenarios and the exact number of accesses to instruments. Moreover, the number of accesses might change due to late design changes, addition/exclusion of tests, and changes of constraints. In this paper, we analyze and compare seven IEEE 1687 compatible network design approaches in terms of instrument access time, hardware overhead, and robustness. Given the similarities between IEEE 1149.1-2013 and IEEE 1687, the conclusions are also applicable to IEEE 1149.1-2013 networks. (Less)
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
[Host publication title missing]
pages
10 pages
conference name
IEEE International Test Conference, 2014
external identifiers
  • Scopus:84954289592
DOI
10.1109/TEST.2014.7035321
language
English
LU publication?
yes
id
e5c4f719-f7cc-4fc5-8131-152c2040774c (old id 4731530)
date added to LUP
2014-10-31 11:00:29
date last changed
2017-01-01 08:14:48
@inproceedings{e5c4f719-f7cc-4fc5-8131-152c2040774c,
  abstract     = {It is common to embed instruments when developing integrated circuits (ICs). These instruments are accessed at post-silicon validation, debugging, wafer sort, package test, burn-in, printed circuit board bring-up, printed circuit board assembly manufacturing test, power-on self-test, and operator-driven in-field test. At any of these scenarios, it is of interest to access some but not all of the instruments. IEEE 1149.1-2013 and IEEE 1687 propose Test Access Port based (TAP-based) mechanisms to design flexible scan networks such that any combination of instruments can be accessed from outside of the IC. Previous works optimize TAP-based scan networks for one scenario with a known number of accesses. However, at design time, it is difficult to foresee all needed scenarios and the exact number of accesses to instruments. Moreover, the number of accesses might change due to late design changes, addition/exclusion of tests, and changes of constraints. In this paper, we analyze and compare seven IEEE 1687 compatible network design approaches in terms of instrument access time, hardware overhead, and robustness. Given the similarities between IEEE 1149.1-2013 and IEEE 1687, the conclusions are also applicable to IEEE 1149.1-2013 networks.},
  author       = {Ghani Zadegan, Farrokh and Carlsson, Gunnar and Larsson, Erik},
  booktitle    = {[Host publication title missing]},
  language     = {eng},
  pages        = {10},
  title        = {Robustness of TAP-based Scan Networks},
  url          = {http://dx.doi.org/10.1109/TEST.2014.7035321},
  year         = {2014},
}