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Design, Verification and Application of IEEE 1687

Ghani Zadegan, Farrokh LU ; Larsson, Erik LU ; Jutman, Artur; Devadze, Sergei and Krenz-Baath, René (2014) Asian Test Symposium (ATS14) In [Host publication title missing] p.93-100
Abstract
IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
[Host publication title missing]
pages
8 pages
publisher
IEEE--Institute of Electrical and Electronics Engineers Inc.
conference name
Asian Test Symposium (ATS14)
external identifiers
  • scopus:84919980191
ISSN
1081-7735
DOI
10.1109/ATS.2014.28
language
English
LU publication?
yes
id
8df64909-be37-4ade-af24-2b0c05dd87e0 (old id 4731540)
date added to LUP
2014-10-31 11:02:34
date last changed
2017-06-25 04:15:20
@inproceedings{8df64909-be37-4ade-af24-2b0c05dd87e0,
  abstract     = {IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.},
  author       = {Ghani Zadegan, Farrokh and Larsson, Erik and Jutman, Artur and Devadze, Sergei and Krenz-Baath, René},
  booktitle    = {[Host publication title missing]},
  issn         = {1081-7735},
  language     = {eng},
  pages        = {93--100},
  publisher    = {IEEE--Institute of Electrical and Electronics Engineers Inc.},
  title        = {Design, Verification and Application of IEEE 1687},
  url          = {http://dx.doi.org/10.1109/ATS.2014.28},
  year         = {2014},
}