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Design, Verification and Application of IEEE 1687

Ghani Zadegan, Farrokh LU ; Larsson, Erik LU orcid ; Jutman, Artur ; Devadze, Sergei and Krenz-Baath, René (2014) Asian Test Symposium (ATS14) p.93-100
Abstract
IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.
Please use this url to cite or link to this publication:
author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
host publication
[Host publication title missing]
pages
8 pages
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
Asian Test Symposium (ATS14)
conference location
Hangzhou, China
conference dates
2014-11-16 - 2014-11-19
external identifiers
  • scopus:84919980191
  • wos:000380895400016
ISSN
1081-7735
DOI
10.1109/ATS.2014.28
language
English
LU publication?
yes
id
8df64909-be37-4ade-af24-2b0c05dd87e0 (old id 4731540)
date added to LUP
2016-04-01 14:59:53
date last changed
2022-04-06 21:35:37
@inproceedings{8df64909-be37-4ade-af24-2b0c05dd87e0,
  abstract     = {{IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing number of embedded instruments in today's integrated circuits. These instruments enable efficient post-silicon validation, debugging, wafer sort, package test, burn-in, bring-up and manufacturing test of printed circuit board assemblies, power-on self-test, and in-field test. Current paper presents an overview of challenges as well as selected examples in the following topics around IEEE 1687 networks: (1) design to efficiently access the embedded instruments, (2) verification to ensure correctness, and (3) fault management at functions performed in-field through the product's life time.}},
  author       = {{Ghani Zadegan, Farrokh and Larsson, Erik and Jutman, Artur and Devadze, Sergei and Krenz-Baath, René}},
  booktitle    = {{[Host publication title missing]}},
  issn         = {{1081-7735}},
  language     = {{eng}},
  pages        = {{93--100}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Design, Verification and Application of IEEE 1687}},
  url          = {{https://lup.lub.lu.se/search/files/4291638/4882071.pdf}},
  doi          = {{10.1109/ATS.2014.28}},
  year         = {{2014}},
}