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- 2014
-
Mark
Design, Verification and Application of IEEE 1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2012
-
Mark
Accessing Embedded DfT Instruments with IEEE P1687
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2011
-
Mark
Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2004
-
Mark
An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2003
-
Mark
SOC Test Time Minimization Under Multiple Constraints
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
-
Mark
Optimal System-on-Chip Test Scheduling
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2002
-
Mark
Integrated Test Scheduling, Test Parallelization and TAM Design
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding
- 2001
-
Mark
Test Scheduling and Scan-Chain Division Under Power Constraint
(
- Chapter in Book/Report/Conference proceeding › Paper in conference proceeding