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Test Scheduling and Scan-Chain Division Under Power Constraint

Larsson, Erik LU orcid and Peng, Zebo (2001) Tenth Asian Test Symposium ATS 2001 p.259-259
Abstract
An integrated technique for test scheduling and scan-chain division under power constraints is proposed in this paper. We demonstrate that optimal test time can be achieved for systems tested by an arbitrary number of tests per core using scan-chain division and we define an algorithm for it. The design of wrappers to allow different lengths of scan-chains per core is also outlined. We investigate the practical limitations of such wrapper design and make a worst case analysis that motivates our integrated test scheduling and scan-chain division algorithm. The efficiency and usefulness of our approach have been demonstrated with an industrial design.
Please use this url to cite or link to this publication:
author
and
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
scan-chain, test scheduling, wrapper design, testing, embedded systems
host publication
[Host publication title missing]
pages
259 - 259
publisher
IEEE - Institute of Electrical and Electronics Engineers Inc.
conference name
Tenth Asian Test Symposium ATS 2001
conference location
Kyoto, Japan
conference dates
2001-11-19 - 2001-11-21
external identifiers
  • scopus:0035704354
ISSN
1081-7735
ISBN
0-7695-1378-6
DOI
10.1109/ATS.2001.990292
language
English
LU publication?
no
id
73496a98-6c9a-4801-ba5d-cbf69acc010d (old id 2341101)
date added to LUP
2016-04-01 16:57:42
date last changed
2025-04-04 15:29:29
@inproceedings{73496a98-6c9a-4801-ba5d-cbf69acc010d,
  abstract     = {{An integrated technique for test scheduling and scan-chain division under power constraints is proposed in this paper. We demonstrate that optimal test time can be achieved for systems tested by an arbitrary number of tests per core using scan-chain division and we define an algorithm for it. The design of wrappers to allow different lengths of scan-chains per core is also outlined. We investigate the practical limitations of such wrapper design and make a worst case analysis that motivates our integrated test scheduling and scan-chain division algorithm. The efficiency and usefulness of our approach have been demonstrated with an industrial design.}},
  author       = {{Larsson, Erik and Peng, Zebo}},
  booktitle    = {{[Host publication title missing]}},
  isbn         = {{0-7695-1378-6}},
  issn         = {{1081-7735}},
  keywords     = {{scan-chain; test scheduling; wrapper design; testing; embedded systems}},
  language     = {{eng}},
  pages        = {{259--259}},
  publisher    = {{IEEE - Institute of Electrical and Electronics Engineers Inc.}},
  title        = {{Test Scheduling and Scan-Chain Division Under Power Constraint}},
  url          = {{http://dx.doi.org/10.1109/ATS.2001.990292}},
  doi          = {{10.1109/ATS.2001.990292}},
  year         = {{2001}},
}