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Hard X-ray Detection Using a Single nm Diameter Nanowire

Wallentin, Jesper; Osterhoff, Markus; Wilke, Robin N.; Persson, Karl-Magnus LU ; Wernersson, Lars-Erik LU ; Sprung, Michael and Salditt, Tim (2014) In Nano Letters 14(12). p.7071-7076
Abstract
Submicron sized sensors could allow higher resolution in X-ray imaging and diffraction measurements, which are ubiquitous for materials science and medicine. We present electrical measurements of a single 100 nm diameter InP nanowire transistor exposed to hard X-rays. The X-ray induced conductance is over 5 orders of magnitude larger than expected from reported data for X-ray absorption and carrier lifetimes. Time-resolved measurements show very long characteristic lifetimes on the order of seconds, tentatively attributed to long-lived traps, which give a strong amplification effect. As a proof of concept, we use the nanowire to directly image an X-ray nanofocus with submicron resolution.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Nanowires, X-rays, detector, III-V
in
Nano Letters
volume
14
issue
12
pages
7071 - 7076
publisher
The American Chemical Society
external identifiers
  • wos:000346322800049
  • scopus:84916624101
ISSN
1530-6992
DOI
10.1021/nl5040545
language
English
LU publication?
yes
id
130a9b5b-8e54-414b-b9a5-f76859ead926 (old id 4944730)
date added to LUP
2015-01-28 12:49:12
date last changed
2017-08-27 05:00:47
@article{130a9b5b-8e54-414b-b9a5-f76859ead926,
  abstract     = {Submicron sized sensors could allow higher resolution in X-ray imaging and diffraction measurements, which are ubiquitous for materials science and medicine. We present electrical measurements of a single 100 nm diameter InP nanowire transistor exposed to hard X-rays. The X-ray induced conductance is over 5 orders of magnitude larger than expected from reported data for X-ray absorption and carrier lifetimes. Time-resolved measurements show very long characteristic lifetimes on the order of seconds, tentatively attributed to long-lived traps, which give a strong amplification effect. As a proof of concept, we use the nanowire to directly image an X-ray nanofocus with submicron resolution.},
  author       = {Wallentin, Jesper and Osterhoff, Markus and Wilke, Robin N. and Persson, Karl-Magnus and Wernersson, Lars-Erik and Sprung, Michael and Salditt, Tim},
  issn         = {1530-6992},
  keyword      = {Nanowires,X-rays,detector,III-V},
  language     = {eng},
  number       = {12},
  pages        = {7071--7076},
  publisher    = {The American Chemical Society},
  series       = {Nano Letters},
  title        = {Hard X-ray Detection Using a Single nm Diameter Nanowire},
  url          = {http://dx.doi.org/10.1021/nl5040545},
  volume       = {14},
  year         = {2014},
}