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Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses

Chekalin, Sergey V.; Kompanets, V. O.; Letokhov, Vladilen LU ; Matveets, Yu A.; Mironov, B. N. and Sekatskii, S. K. (2004) In International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004). 5402. p.17-24
Abstract
It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first... (More)
It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first nonperturbing measurement of sucha distribution. (Less)
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publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
in
International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004).
volume
5402
pages
17 - 24
publisher
SPIE
external identifiers
  • Scopus:3042590905
DOI
10.1117/12.558810
language
English
LU publication?
no
id
6c555637-9475-4ce0-8c6c-bfe89fa16485 (old id 527793)
date added to LUP
2007-09-13 13:40:19
date last changed
2017-01-01 08:02:39
@inproceedings{6c555637-9475-4ce0-8c6c-bfe89fa16485,
  abstract     = {It is shown that the high-resolution laser photoelectron microscope withsubwavelength-spatial resolution can be used for an absolute values ofthe two-photon external photoelectric effect measurements with high (afew nm-scale) localization. The spatial distribution of light intensityin the near field is studied by observing the photoelectron projectionimages of a subwavelength nanoaperture. The imaging electrons areobtained as a result of two-photon external photoelectric effect inducedin the aperture formed at the end of an optical fiber by femtosecondpulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser.The light-field distribution in the aperture is not distorted by anynear-by object, which allows the first nonperturbing measurement of sucha distribution.},
  author       = {Chekalin, Sergey V. and Kompanets, V. O. and Letokhov, Vladilen and Matveets, Yu A. and Mironov, B. N. and Sekatskii, S. K.},
  booktitle    = {International Workshop on Quantum Optics 2003. Edited by Samartsev, Vitaly V. Proceedings of the SPIE, Volume 5402, pp. 17-24 (2004).},
  language     = {eng},
  pages        = {17--24},
  publisher    = {SPIE},
  title        = {Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses},
  url          = {http://dx.doi.org/10.1117/12.558810},
  volume       = {5402},
  year         = {2004},
}