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Photoemission electron microscopy of localized surface plasmons in silver nanostructures at telecommunication wavelengths

Mårsell, Erik LU ; Witting Larsen, Esben LU ; Arnold, Cord LU ; Xu, Hongxing LU ; Mauritsson, Johan LU and Mikkelsen, Anders LU (2015) In Applied Physics Reviews 117(8).
Abstract
We image the field enhancement at Ag nanostructures using femtosecond laser pulses with a center wavelength of 1.55 mu m. Imaging is based on non-linear photoemission observed in a photoemission electron microscope (PEEM). The images are directly compared to ultra violet PEEM and scanning electron microscopy (SEM) imaging of the same structures. Further, we have carried out atomic scale scanning tunneling microscopy on the same type of Ag nanostructures and on the Au substrate. Measuring the photoelectron spectrum from individual Ag particles shows a larger contribution from higher order photoemission processes above the work function threshold than would be predicted by a fully perturbative model, consistent with recent results using... (More)
We image the field enhancement at Ag nanostructures using femtosecond laser pulses with a center wavelength of 1.55 mu m. Imaging is based on non-linear photoemission observed in a photoemission electron microscope (PEEM). The images are directly compared to ultra violet PEEM and scanning electron microscopy (SEM) imaging of the same structures. Further, we have carried out atomic scale scanning tunneling microscopy on the same type of Ag nanostructures and on the Au substrate. Measuring the photoelectron spectrum from individual Ag particles shows a larger contribution from higher order photoemission processes above the work function threshold than would be predicted by a fully perturbative model, consistent with recent results using shorter wavelengths. Investigating a wide selection of both Ag nanoparticles and nanowires, field enhancement is observed from 30% of the Ag nanoparticles and from none of the nanowires. No laser-induced damage is observed of the nanostructures neither during the PEEM experiments nor in subsequent SEM analysis. By direct comparison of SEM and PEEM images of the same nanostructures, we can conclude that the field enhancement is independent of the average nanostructure size and shape. Instead, we propose that the variations in observed field enhancement could originate from the wedge interface between the substrate and particles electrically connected to the substrate. (C) 2015 AIP Publishing LLC. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Applied Physics Reviews
volume
117
issue
8
publisher
American Institute of Physics
external identifiers
  • wos:000351132500004
  • scopus:84923869774
ISSN
0021-8979
DOI
10.1063/1.4913310
language
English
LU publication?
yes
id
0c10b514-435d-401a-820f-c77709291ecc (old id 5293794)
date added to LUP
2015-04-24 15:35:01
date last changed
2017-01-01 03:52:37
@article{0c10b514-435d-401a-820f-c77709291ecc,
  abstract     = {We image the field enhancement at Ag nanostructures using femtosecond laser pulses with a center wavelength of 1.55 mu m. Imaging is based on non-linear photoemission observed in a photoemission electron microscope (PEEM). The images are directly compared to ultra violet PEEM and scanning electron microscopy (SEM) imaging of the same structures. Further, we have carried out atomic scale scanning tunneling microscopy on the same type of Ag nanostructures and on the Au substrate. Measuring the photoelectron spectrum from individual Ag particles shows a larger contribution from higher order photoemission processes above the work function threshold than would be predicted by a fully perturbative model, consistent with recent results using shorter wavelengths. Investigating a wide selection of both Ag nanoparticles and nanowires, field enhancement is observed from 30% of the Ag nanoparticles and from none of the nanowires. No laser-induced damage is observed of the nanostructures neither during the PEEM experiments nor in subsequent SEM analysis. By direct comparison of SEM and PEEM images of the same nanostructures, we can conclude that the field enhancement is independent of the average nanostructure size and shape. Instead, we propose that the variations in observed field enhancement could originate from the wedge interface between the substrate and particles electrically connected to the substrate. (C) 2015 AIP Publishing LLC.},
  articleno    = {083104},
  author       = {Mårsell, Erik and Witting Larsen, Esben and Arnold, Cord and Xu, Hongxing and Mauritsson, Johan and Mikkelsen, Anders},
  issn         = {0021-8979},
  language     = {eng},
  number       = {8},
  publisher    = {American Institute of Physics},
  series       = {Applied Physics Reviews},
  title        = {Photoemission electron microscopy of localized surface plasmons in silver nanostructures at telecommunication wavelengths},
  url          = {http://dx.doi.org/10.1063/1.4913310},
  volume       = {117},
  year         = {2015},
}