In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM
(2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)- Abstract
- A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM
Please use this url to cite or link to this publication:
https://lup.lub.lu.se/record/611853
- author
- Larsson, Magnus LU ; Wallenberg, Reine LU ; Persson, A.I. ; Ohlsson, B.J. and Samuelson, L.
- organization
- publishing date
- 2002
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- transmission electron microscopy, STM, scanning tunnelling microscopy, III-V nanowhiskers, in situ manipulations, electrical measurements, TEM, semiconductor nanowhiskers, nano structures, InAs/InP nanowhisker, InAs-InP
- host publication
- 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
- pages
- 2 pages
- publisher
- Lund University
- conference name
- Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
- conference location
- Malmö, Sweden
- conference dates
- 2002-06-24 - 2002-06-28
- language
- English
- LU publication?
- yes
- additional info
- The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)
- id
- 5eb4211e-8193-4d9d-9e26-55a2eada4e31 (old id 611853)
- date added to LUP
- 2016-04-04 11:10:11
- date last changed
- 2018-11-21 21:03:05
@inproceedings{5eb4211e-8193-4d9d-9e26-55a2eada4e31, abstract = {{A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM}}, author = {{Larsson, Magnus and Wallenberg, Reine and Persson, A.I. and Ohlsson, B.J. and Samuelson, L.}}, booktitle = {{7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science}}, keywords = {{transmission electron microscopy; STM; scanning tunnelling microscopy; III-V nanowhiskers; in situ manipulations; electrical measurements; TEM; semiconductor nanowhiskers; nano structures; InAs/InP nanowhisker; InAs-InP}}, language = {{eng}}, publisher = {{Lund University}}, title = {{In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM}}, year = {{2002}}, }