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In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM

Larsson, Magnus LU ; Wallenberg, Reine LU ; Persson, A.I. ; Ohlsson, B.J. and Samuelson, L. (2002) Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
Abstract
A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM
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author
; ; ; and
organization
publishing date
type
Chapter in Book/Report/Conference proceeding
publication status
published
subject
keywords
transmission electron microscopy, STM, scanning tunnelling microscopy, III-V nanowhiskers, in situ manipulations, electrical measurements, TEM, semiconductor nanowhiskers, nano structures, InAs/InP nanowhisker, InAs-InP
host publication
7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science
pages
2 pages
publisher
Lund University
conference name
Proceedings of 7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science (NANO-7/ECOSS-21)
conference location
Malmö, Sweden
conference dates
2002-06-24 - 2002-06-28
language
English
LU publication?
yes
additional info
The information about affiliations in this record was updated in December 2015. The record was previously connected to the following departments: Polymer and Materials Chemistry (LTH) (011001041)
id
5eb4211e-8193-4d9d-9e26-55a2eada4e31 (old id 611853)
date added to LUP
2016-04-04 11:10:11
date last changed
2018-11-21 21:03:05
@inproceedings{5eb4211e-8193-4d9d-9e26-55a2eada4e31,
  abstract     = {A scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TEM},
  author       = {Larsson, Magnus and Wallenberg, Reine and Persson, A.I. and Ohlsson, B.J. and Samuelson, L.},
  booktitle    = {7th International Conference on Nanometer-Scale Science and Technology and 21st European Conference on Surface Science},
  language     = {eng},
  publisher    = {Lund University},
  title        = {In-situ manipulations and electrical measurements of III-V nanowhiskers with TEM-STM},
  year         = {2002},
}