Advanced

Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques

Eymery, Joel; Rieutord, Francois; Favre-Nicolin, Vincent; Robach, Odile; Niquet, Yann-Michel; Fröberg, Linus LU ; Mårtensson, Thomas LU and Samuelson, Lars LU (2007) In Nano Letters 7(9). p.2596-2601
Abstract
Quantitative structural information about epitaxial arrays of nanowires are reported for a InAs/InP longitudinal heterostructure grown by chemical beam epitaxy on an InAs (111)(B) substrate. Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain in homogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.
Please use this url to cite or link to this publication:
author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
Nano Letters
volume
7
issue
9
pages
2596 - 2601
publisher
The American Chemical Society
external identifiers
  • wos:000249501900010
  • scopus:34948828176
ISSN
1530-6992
DOI
10.1021/nl070888q
language
English
LU publication?
yes
id
32a2ceac-905c-4540-9f5c-33d751777c00 (old id 656452)
date added to LUP
2007-12-10 09:33:43
date last changed
2017-09-17 07:31:40
@article{32a2ceac-905c-4540-9f5c-33d751777c00,
  abstract     = {Quantitative structural information about epitaxial arrays of nanowires are reported for a InAs/InP longitudinal heterostructure grown by chemical beam epitaxy on an InAs (111)(B) substrate. Grazing incidence X-ray diffraction allows the separation of the nanowire contribution from the substrate overgrowth and gives averaged information about crystallographic phases, epitaxial relationships (with orientation distribution), and strain. In-plane strain in homogeneities, intrinsic to the nanowires geometry, are measured and compared to atomistic simulations. Small-angle X-ray scattering evidences the hexagonal symmetry of the nanowire cross-section and provides a rough estimate of size fluctuations.},
  author       = {Eymery, Joel and Rieutord, Francois and Favre-Nicolin, Vincent and Robach, Odile and Niquet, Yann-Michel and Fröberg, Linus and Mårtensson, Thomas and Samuelson, Lars},
  issn         = {1530-6992},
  language     = {eng},
  number       = {9},
  pages        = {2596--2601},
  publisher    = {The American Chemical Society},
  series       = {Nano Letters},
  title        = {Strain and shape of epitaxial InAs/InP nanowire superlattice measured by grazing incidence X-ray techniques},
  url          = {http://dx.doi.org/10.1021/nl070888q},
  volume       = {7},
  year         = {2007},
}