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In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy

Lotze, Gudrun LU ; Iyer, Anand H.S. ; Bäcke, Olof ; Kalbfleisch, Sebastian LU and Colliander, Magnus Hörnqvist (2024) In Journal of Synchrotron Radiation 31(Pt 1). p.42-54
Abstract

The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples... (More)

The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.

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author
; ; ; and
organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
in situ deformation, nanodiffraction, nanoindentation, sample environment, stress mapping
in
Journal of Synchrotron Radiation
volume
31
issue
Pt 1
pages
13 pages
publisher
International Union of Crystallography
external identifiers
  • pmid:38095669
  • scopus:85181848677
ISSN
0909-0495
DOI
10.1107/S1600577523010093
language
English
LU publication?
yes
id
66086d78-39c4-4747-bd4e-4c65d67ff540
date added to LUP
2024-02-06 11:58:59
date last changed
2025-05-07 05:48:55
@article{66086d78-39c4-4747-bd4e-4c65d67ff540,
  abstract     = {{<p>The use of hard X-ray transmission nano- and microdiffraction to perform in situ stress and strain measurements during deformation has recently been demonstrated and used to investigate many thin film systems. Here a newly commissioned sample environment based on a commercially available nanoindenter is presented, which is available at the NanoMAX beamline at the MAX IV synchrotron. Using X-ray nanoprobes of around 60-70 nm at 14-16 keV and a scanning step size of 100 nm, we map the strains, stresses, plastic deformation and fracture during nanoindentation of industrial coatings with thicknesses in the range of several micrometres, relatively strong texture and large grains. The successful measurements of such challenging samples illustrate broad applicability. The sample environment is openly accessible for NanoMAX beamline users through the MAX IV sample environment pool, and its capability can be further extended for specific purposes through additional available modules.</p>}},
  author       = {{Lotze, Gudrun and Iyer, Anand H.S. and Bäcke, Olof and Kalbfleisch, Sebastian and Colliander, Magnus Hörnqvist}},
  issn         = {{0909-0495}},
  keywords     = {{in situ deformation; nanodiffraction; nanoindentation; sample environment; stress mapping}},
  language     = {{eng}},
  number       = {{Pt 1}},
  pages        = {{42--54}},
  publisher    = {{International Union of Crystallography}},
  series       = {{Journal of Synchrotron Radiation}},
  title        = {{In situ characterization of stresses, deformation and fracture of thin films using transmission X-ray nanodiffraction microscopy}},
  url          = {{http://dx.doi.org/10.1107/S1600577523010093}},
  doi          = {{10.1107/S1600577523010093}},
  volume       = {{31}},
  year         = {{2024}},
}