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Current-voltage correlations in interferometers

Foerster, Heidi; Samuelsson, Peter LU and Buettiker, Markus (2007) In New Journal of Physics 9.
Abstract
We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in... (More)
We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here. (Less)
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author
organization
publishing date
type
Contribution to journal
publication status
published
subject
in
New Journal of Physics
volume
9
publisher
IOP Publishing Ltd.
external identifiers
  • wos:000246650800007
  • scopus:34248333858
ISSN
1367-2630
DOI
10.1088/1367-2630/9/5/117
language
English
LU publication?
yes
id
36d92e8f-cea1-4b48-8a5f-8e091f1aad90 (old id 662962)
date added to LUP
2007-12-10 13:15:20
date last changed
2017-01-01 07:15:14
@article{36d92e8f-cea1-4b48-8a5f-8e091f1aad90,
  abstract     = {We investigate correlations of current at contacts and voltage fluctuations at voltage probes coupled to interferometers. The results are compared with correlations of current and occupation number fluctuations at dephasing probes. We use a quantum Langevin approach for the average quantities and their fluctuations. For higher order correlations we develop a stochastic path integral approach and find the generating functions of voltage or occupation number fluctuations. We also derive a generating function for the joint distribution of voltage or occupation number at the probe and current fluctuations at a terminal of a conductor. For energy independent scattering we found earlier that the generating function of current cumulants in interferometers with a one-channel dephasing or voltage probe are identical. Nevertheless, the distribution function for voltage and the distribution function for occupation number fluctuations differ, the latter being broader than that of the former in all examples considered here.},
  author       = {Foerster, Heidi and Samuelsson, Peter and Buettiker, Markus},
  issn         = {1367-2630},
  language     = {eng},
  publisher    = {IOP Publishing Ltd.},
  series       = {New Journal of Physics},
  title        = {Current-voltage correlations in interferometers},
  url          = {http://dx.doi.org/10.1088/1367-2630/9/5/117},
  volume       = {9},
  year         = {2007},
}