Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films
(2010) In Journal of Physics: Conference Series 211.- Abstract
The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.
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https://lup.lub.lu.se/record/67179236-b0b0-421c-a8a8-a985c1537462
- author
- Tonnerre, J. M. ; Jaouen, N. ; Bontempi, E. ; Carbone, D. LU ; Babonneau, D. ; De Santis, M. LU ; Tolentino, N. ; Grenier, S. ; Garaudee, S. and Staub, U.
- publishing date
- 2010
- type
- Contribution to journal
- publication status
- published
- in
- Journal of Physics: Conference Series
- volume
- 211
- article number
- 012015
- publisher
- IOP Publishing
- external identifiers
-
- scopus:77950472785
- ISSN
- 1742-6588
- DOI
- 10.1088/1742-6596/211/1/012015
- language
- English
- LU publication?
- no
- id
- 67179236-b0b0-421c-a8a8-a985c1537462
- date added to LUP
- 2021-12-15 12:00:01
- date last changed
- 2022-02-02 02:08:43
@article{67179236-b0b0-421c-a8a8-a985c1537462, abstract = {{<p>The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.</p>}}, author = {{Tonnerre, J. M. and Jaouen, N. and Bontempi, E. and Carbone, D. and Babonneau, D. and De Santis, M. and Tolentino, N. and Grenier, S. and Garaudee, S. and Staub, U.}}, issn = {{1742-6588}}, language = {{eng}}, publisher = {{IOP Publishing}}, series = {{Journal of Physics: Conference Series}}, title = {{Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films}}, url = {{http://dx.doi.org/10.1088/1742-6596/211/1/012015}}, doi = {{10.1088/1742-6596/211/1/012015}}, volume = {{211}}, year = {{2010}}, }