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Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films

Tonnerre, J. M. ; Jaouen, N. ; Bontempi, E. ; Carbone, D. LU ; Babonneau, D. ; De Santis, M. LU orcid ; Tolentino, N. ; Grenier, S. ; Garaudee, S. and Staub, U. (2010) In Journal of Physics: Conference Series 211.
Abstract

The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.

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author
; ; ; ; ; ; ; ; and
publishing date
type
Contribution to journal
publication status
published
in
Journal of Physics: Conference Series
volume
211
article number
012015
publisher
IOP Publishing
external identifiers
  • scopus:77950472785
ISSN
1742-6588
DOI
10.1088/1742-6596/211/1/012015
language
English
LU publication?
no
id
67179236-b0b0-421c-a8a8-a985c1537462
date added to LUP
2021-12-15 12:00:01
date last changed
2022-02-02 02:08:43
@article{67179236-b0b0-421c-a8a8-a985c1537462,
  abstract     = {{<p>The possibility to investigate complex magnetic profiles throughout an ultrathin magnetic film or an interface by soft x-ray resonant magnetic reflectivity is presented. The determination of in- and out-of-plane magnetic profile is shown to be possible with a subnanometer resolution by measuring the reflectivity over a wide angular range. The technique is applied to a granular magnetic multilayer and to a perpendicular exchange bias coupled system.</p>}},
  author       = {{Tonnerre, J. M. and Jaouen, N. and Bontempi, E. and Carbone, D. and Babonneau, D. and De Santis, M. and Tolentino, N. and Grenier, S. and Garaudee, S. and Staub, U.}},
  issn         = {{1742-6588}},
  language     = {{eng}},
  publisher    = {{IOP Publishing}},
  series       = {{Journal of Physics: Conference Series}},
  title        = {{Soft x-ray resonant magnetic reflectivity studies for in-and out-of-plane magnetization profile in ultra thin films}},
  url          = {{http://dx.doi.org/10.1088/1742-6596/211/1/012015}},
  doi          = {{10.1088/1742-6596/211/1/012015}},
  volume       = {{211}},
  year         = {{2010}},
}