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BETSEE : testing for system-wide effects of single event effects on ITk strip modules

Belanger-Champagne, C. ; Dandoy, J. ; Gallop, B. ; Gosart, T. ; Helling, C. ; Keener, P. ; Krizka, K. ; McGovern, B. ; Mullier, G. LU and Poley, A. L. , et al. (2023) In Journal of Instrumentation 18(1).
Abstract

The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.

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organization
publishing date
type
Contribution to journal
publication status
published
subject
keywords
Digital electronic circuits, Front-end electronics for detector readout, Radiation-hard detectors
in
Journal of Instrumentation
volume
18
issue
1
article number
C01019
publisher
IOP Publishing
external identifiers
  • scopus:85146491173
ISSN
1748-0221
DOI
10.1088/1748-0221/18/01/C01019
language
English
LU publication?
yes
id
710c7041-7a6c-4b47-9e65-a24650683a42
date added to LUP
2024-01-12 12:25:17
date last changed
2024-01-12 12:27:21
@article{710c7041-7a6c-4b47-9e65-a24650683a42,
  abstract     = {{<p>The Inner Tracker silicon strip detector (ITk Strip) is a part of the ATLAS upgrade for the HL-LHC. The detector readout and control is accomplished by the interaction of three on-module custom ASICs (ABCStarv1, HCCStarv1 and AMACstar). All ASICs are designed with protections against Single Event Errors. Their resilience at the system-level can be tested using the Board for Evaluation of Triple-chip Single Event Effects (BETSEE). This special board places all three ASICs into the beam-spot of a test beam facility concurrently and allows for module-like operation. The results from irradiating BETSEE with heavy ions and protons will be presented.</p>}},
  author       = {{Belanger-Champagne, C. and Dandoy, J. and Gallop, B. and Gosart, T. and Helling, C. and Keener, P. and Krizka, K. and McGovern, B. and Mullier, G. and Poley, A. L. and Roberts, B. and Sawyer, C. and Wall, A. and Wang, H. and Warren, M.}},
  issn         = {{1748-0221}},
  keywords     = {{Digital electronic circuits; Front-end electronics for detector readout; Radiation-hard detectors}},
  language     = {{eng}},
  month        = {{01}},
  number       = {{1}},
  publisher    = {{IOP Publishing}},
  series       = {{Journal of Instrumentation}},
  title        = {{BETSEE : testing for system-wide effects of single event effects on ITk strip modules}},
  url          = {{http://dx.doi.org/10.1088/1748-0221/18/01/C01019}},
  doi          = {{10.1088/1748-0221/18/01/C01019}},
  volume       = {{18}},
  year         = {{2023}},
}