X-ray standing-wave spectroscopy : A powerful method for probing buried interfaces
(2023) 1-3. p.1-335- Abstract
In this chapter we present a non-destructive method for characterizing buried interfaces with high depth resolution combining X-rays standing wave and photoemission electron spectroscopy. This method incorporates the power of the X-rays photoelectron spectroscopy, which is a surface sensitive technique in the nanometer and sub-nanometer regime, with the depth selectivity of X-ray standing wave. This method has been successfully applied to study solid/solid interfaces and, more recently, solid/gas and solid/liquid interfaces, as we demonstrate on several examples. In addition, we also describe a few examples of liquid/solid interface characterization by standing wave X-ray fluorescence relevant for catalysis, energy science and... (More)
In this chapter we present a non-destructive method for characterizing buried interfaces with high depth resolution combining X-rays standing wave and photoemission electron spectroscopy. This method incorporates the power of the X-rays photoelectron spectroscopy, which is a surface sensitive technique in the nanometer and sub-nanometer regime, with the depth selectivity of X-ray standing wave. This method has been successfully applied to study solid/solid interfaces and, more recently, solid/gas and solid/liquid interfaces, as we demonstrate on several examples. In addition, we also describe a few examples of liquid/solid interface characterization by standing wave X-ray fluorescence relevant for catalysis, energy science and biomedical applications.
(Less)
- author
- Conti, Giuseppina ; Shavorskiy, Andrey LU ; Bluhm, Hendrik and Nemšák, Slavomír
- organization
- publishing date
- 2023
- type
- Chapter in Book/Report/Conference proceeding
- publication status
- published
- subject
- keywords
- Ambient pressure X-ray photoelectron spectroscopy, Near total reflection X-ray photoelectron spectroscopy, Solid/liquid interface, Solid/solid interface, Standing wave X-ray photoelectron spectroscopy, X-ray fluorescence, X-ray photoemission
- host publication
- Encyclopedia of Solid-Liquid Interfaces
- volume
- 1-3
- pages
- 1 - 335
- publisher
- Elsevier
- external identifiers
-
- scopus:85191806405
- ISBN
- 9780323856690
- DOI
- 10.1016/B978-0-323-85669-0.00141-0
- language
- English
- LU publication?
- yes
- id
- 72786ed4-024a-4df5-895e-987186d34fb6
- date added to LUP
- 2024-05-21 14:12:44
- date last changed
- 2024-09-17 11:07:42
@inbook{72786ed4-024a-4df5-895e-987186d34fb6,
abstract = {{<p>In this chapter we present a non-destructive method for characterizing buried interfaces with high depth resolution combining X-rays standing wave and photoemission electron spectroscopy. This method incorporates the power of the X-rays photoelectron spectroscopy, which is a surface sensitive technique in the nanometer and sub-nanometer regime, with the depth selectivity of X-ray standing wave. This method has been successfully applied to study solid/solid interfaces and, more recently, solid/gas and solid/liquid interfaces, as we demonstrate on several examples. In addition, we also describe a few examples of liquid/solid interface characterization by standing wave X-ray fluorescence relevant for catalysis, energy science and biomedical applications.</p>}},
author = {{Conti, Giuseppina and Shavorskiy, Andrey and Bluhm, Hendrik and Nemšák, Slavomír}},
booktitle = {{Encyclopedia of Solid-Liquid Interfaces}},
isbn = {{9780323856690}},
keywords = {{Ambient pressure X-ray photoelectron spectroscopy; Near total reflection X-ray photoelectron spectroscopy; Solid/liquid interface; Solid/solid interface; Standing wave X-ray photoelectron spectroscopy; X-ray fluorescence; X-ray photoemission}},
language = {{eng}},
pages = {{1--335}},
publisher = {{Elsevier}},
title = {{X-ray standing-wave spectroscopy : A powerful method for probing buried interfaces}},
url = {{http://dx.doi.org/10.1016/B978-0-323-85669-0.00141-0}},
doi = {{10.1016/B978-0-323-85669-0.00141-0}},
volume = {{1-3}},
year = {{2023}},
}