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The thickness of native oxides on aluminum alloys and single crystals

Evertsson, Jonas LU ; Bertram, Florian LU ; Zhang, F.; Rullik, Lisa LU ; Merte, Lindsay LU ; Shipilin, Mikhail LU ; Soldemo, M.; Ahmadi, S.; Vinogradov, N. and Carla, F., et al. (2015) In Applied Surface Science 349. p.826-832
Abstract
We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy... (More)
We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness. (Less)
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subject
keywords
Aluminum alloy, Aluminum single crystal, Thin native oxide film, thickness, Electrochemical impedance spectroscopy, X-ray reflectivity, X-ray photoelectron spectroscopy
in
Applied Surface Science
volume
349
pages
826 - 832
publisher
Elsevier
external identifiers
  • wos:000357129100109
  • scopus:84937706146
ISSN
1873-5584
DOI
10.1016/j.apsusc.2015.05.043
language
English
LU publication?
yes
id
891585d0-ca90-4395-8de1-9eecd2aae6ac (old id 7790984)
date added to LUP
2015-09-02 11:55:59
date last changed
2017-10-08 03:16:25
@article{891585d0-ca90-4395-8de1-9eecd2aae6ac,
  abstract     = {We present results from measurements of the native oxide film thickness on four different industrial aluminum alloys and three different aluminum single crystals. The thicknesses were determined using X-ray reflectivity, X-ray photoelectron spectroscopy, and electrochemical impedance spectroscopy. In addition, atomic force microscopy was used for micro-structural studies of the oxide surfaces. The reflectivity measurements were performed in ultra-high vacuum, vacuum, ambient, nitrogen and liquid water conditions. The results obtained using X-ray reflectivity and X-ray photoelectron spectroscopy demonstrate good agreement. However, the oxide thicknesses determined from the electrochemical impedance spectroscopy show a larger discrepancy from the above two methods. In the present contribution the reasons for this discrepancy are discussed. We also address the effect of the substrate type and the presence of water on the resultant oxide thickness.},
  author       = {Evertsson, Jonas and Bertram, Florian and Zhang, F. and Rullik, Lisa and Merte, Lindsay and Shipilin, Mikhail and Soldemo, M. and Ahmadi, S. and Vinogradov, N. and Carla, F. and Weissenrieder, J. and Gothelid, M. and Pan, J. and Mikkelsen, Anders and Nilsson, J. -O. and Lundgren, Edvin},
  issn         = {1873-5584},
  keyword      = {Aluminum alloy,Aluminum single crystal,Thin native oxide film,thickness,Electrochemical impedance spectroscopy,X-ray reflectivity,X-ray photoelectron spectroscopy},
  language     = {eng},
  pages        = {826--832},
  publisher    = {Elsevier},
  series       = {Applied Surface Science},
  title        = {The thickness of native oxides on aluminum alloys and single crystals},
  url          = {http://dx.doi.org/10.1016/j.apsusc.2015.05.043},
  volume       = {349},
  year         = {2015},
}